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Patent Searching and Data


Title:
ABNORMALITY DETECTION DEVICE AND ABNORMALITY DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/171156
Kind Code:
A1
Abstract:
This abnormality detection device is provided with: an acquisition unit that is connected to equipment to be monitored and that acquires the state of a relay for controlling switching of a circuit to which the equipment is connected; a detection unit that detects an abnormality in the equipment on the basis of the state of the relay or change in the state of the relay; and a notification unit that notifies a user of the abnormality detected by the detection unit.

Inventors:
HATSUDA TAKENORI (JP)
KAKIUCHI TAKASHI (JP)
YAMAZAKI TAKUYA (JP)
Application Number:
PCT/JP2023/001996
Publication Date:
September 14, 2023
Filing Date:
January 24, 2023
Export Citation:
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Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
H01H47/00; G05B23/02; H01H9/54
Domestic Patent References:
WO2020137260A12020-07-02
Foreign References:
JPS6138745U1986-03-11
Attorney, Agent or Firm:
IP FIRM SHUWA (JP)
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