ABNORMALITY DETECTION METHOD, ABNORMALITY DETECTION DEVICE, AND PROGRAM

Title:

ABNORMALITY DETECTION METHOD, ABNORMALITY DETECTION DEVICE, AND PROGRAM

Document Type and Number:

WIPO Patent Application WO/2022/250054

Kind Code:

A1

Abstract:

An abnormality detection method for a computer to detect abnormality includes: acquiring (S12) first feature amount data to be output via N convolutional layers (N is an integer of 1 or more) of a convolutional neural network when an image is input (S11) to the convolutional neural network constituted as an encoder; acquiring (S13) second feature amount data to be output via M convolutional layers (M is an integer of 1 or more and M ≠ N is satisfied) of the convolutional neural network, the second feature amount data having a size different from that of the first feature amount data; and detecting (S14) abnormality to the image using feature amounts respectively indicated in the first feature amount data and the second feature amount data having mutually different sizes.

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Inventors:

GUDOVSKIY DENIS
ISHIZAKA SHUN (JP)
KOZUKA KAZUKI

Application Number:

PCT/JP2022/021263

Publication Date:

December 01, 2022

Filing Date:

May 24, 2022

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Assignee:

PANASONIC IP CORP AMERICA (US)

International Classes:

G06T7/00

Foreign References:

JP2021081953A

2021-05-27

Attorney, Agent or Firm:

NII, Hiromori et al. (JP)

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