Title:
ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, AND COMPUTER PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/033978
Kind Code:
A1
Abstract:
Provided is an abnormality detection system for detecting an abnormality in a tool attached to a machine tool, the abnormality detection system comprising: a strain sensor that measures a strain occurring in the tool while the machine tool is machining a workpiece using the tool; and an abnormality detection device that detects an abnormality in the tool, on the basis of measured data of the strain sensor. The abnormality detection device includes: a classification unit that is a machine-trained model that receives object data based on the measured data of the strain sensor, and outputs a classification result of the object data; an abnormality detection unit that detects an abnormality in the tool, on the basis of the classification result of the object data from the classification unit; and an output unit that outputs a detection result of the abnormality detection unit.
Inventors:
IWASAKI RUI (JP)
Application Number:
PCT/JP2022/030298
Publication Date:
February 15, 2024
Filing Date:
August 08, 2022
Export Citation:
Assignee:
SUMITOMO ELECTRIC INDUSTRIES (JP)
International Classes:
B23Q17/09
Domestic Patent References:
| WO2021157518A1 | 2021-08-12 |
Foreign References:
| JP2022020722A | 2022-02-01 | |||
| JP7036292B1 | 2022-03-15 | |||
| JP2018024055A | 2018-02-15 | |||
| US20210260777A1 | 2021-08-26 |
Attorney, Agent or Firm:
SUNCREST PATENT AND TRADEMARK ATTORNEYS (JP)
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