Title:
ABNORMALITY DETERMINATION DEVICE AND ABNORMALITY DETERMINATION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/189352
Kind Code:
A1
Abstract:
This abnormality determination device comprises: an acquisition unit that acquires signals corresponding to operations of machines, including a machine tool and a processing machine, capable of repeatedly executing a series of operations; a calculation unit that calculates an evaluation value of an entire series of operations on the basis of the signals acquired during an operation period set in accordance with the length of the series of operations; and a determination unit that performs an abnormality determination as to whether the machine tool is abnormal, on the basis of the calculated evaluation value. The determination unit determines the machine to be abnormal if the calculated evaluation value is greater than a threshold value.
Inventors:
YAMAGUCHI SHOHEI (JP)
OKUMURA RYOSUKE (JP)
TAKATANI RYOHEI (JP)
OKUMURA RYOSUKE (JP)
TAKATANI RYOHEI (JP)
Application Number:
PCT/JP2023/009048
Publication Date:
October 05, 2023
Filing Date:
March 09, 2023
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G05B19/18; B23Q17/00
Foreign References:
| JPS5421687A | 1979-02-19 | |||
| JP2018132884A | 2018-08-23 | |||
| JPH09120365A | 1997-05-06 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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