ABNORMALITY DIAGNOSIS DEVICE, ABNORMALITY DIAGNOSIS METHOD, AND PROGRAM

WIPO Patent Application WO/2023/105623

A1

In order to solve the problem of providing a technology for notifying, when an abnormality in a welded portion is detected, a cause of the abnormality, this abnormality diagnosis device comprises: an acquisition means (21) that acquires time-series data that includes at least one of a current value and a voltage value at the time of first welding; an abnormality determination means (22) that, on the basis of the time-series data acquired by the acquisition means, uses an abnormality determination model, which has learned a relationship between the absence/presence of an abnormality in the welded portion and time-series data that includes at least one of the current value and the voltage value at the time of a second welding, to determine whether there is an abnormality in the welded portion at the time of the first welding; and an output means (23) that outputs, when the abnormality determination means has determined that there is the abnormality, at least one of a determination result, the cause of the abnormality, and a handling method for resolving the abnormality.

TAGATO HIROKI (JP)
SAKAE YOSHIAKI (JP)
KONASHI TAKASHI (JP)
NISHIOKA JUN (JP)
KOBAYASHI YUJI (JP)
KODAMA JUN (JP)
ICHIHARA ETSUKO (JP)

PCT/JP2021/044902

June 15, 2023

December 07, 2021

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NEC CORP (JP)

B23K9/095

JP2018144069A	2018-09-20
JPH10235490A	1998-09-08
JP2010253538A	2010-11-11
JP2020110818A	2020-07-27
JP2008296227A	2008-12-11

HARAKENZO WORLD PATENT & TRADEMARK (JP)

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