Title:
ABNORMALITY DIAGNOSIS DEVICE, ABNORMALITY DIAGNOSIS METHOD, AND ABNORMALITY DIAGNOSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/195281
Kind Code:
A1
Abstract:
This abnormality diagnosis device (100) comprises a signal processing device (10), the signal processing device (10) being provided with a signal processing unit (4), a data storage unit (5), and a discerning unit (6). The signal processing unit (4) performs STFT on waveform data of an input signal and calculates a feature amount. The data storage unit (5) stores feature amount data comprising normal, already-known waveform data. The discerning unit (6) makes a comparison between first feature amount data comprising a plurality of feature amounts calculated by the signal processing unit (4) and second feature amount data that is the feature amount data stored in the data storage unit (5), and discerns the quality of the waveform data of the input signal. The feature amount is the amount representing the degree of variation of spectrum intensity fluctuations over time in a specific frequency band in waveform data.
Inventors:
UEMURA KIMIAKI (JP)
TAMAYA MOTOAKI (JP)
YOSHIOKA TAKASHI (JP)
IKEDA YUICHI (JP)
TANAKA NOBUAKI (JP)
TAMAYA MOTOAKI (JP)
YOSHIOKA TAKASHI (JP)
IKEDA YUICHI (JP)
TANAKA NOBUAKI (JP)
Application Number:
PCT/JP2023/008102
Publication Date:
October 12, 2023
Filing Date:
March 03, 2023
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01H3/08; G01M99/00
Foreign References:
| JP2020060558A | 2020-04-16 | |||
| JP2017181138A | 2017-10-05 | |||
| JP2001125634A | 2001-05-11 |
Attorney, Agent or Firm:
TAKAMURA, Jun (JP)
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