Title:
ABNORMALITY DIAGNOSIS METHOD, ABNORMALITY DIAGNOSIS DEVICE, AND ABNORMALITY DIAGNOSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/209774
Kind Code:
A1
Abstract:
This abnormality diagnosis method, which diagnoses the presence of an abnormality in a facility to be diagnosed, comprises: a step for acquiring, from a facility, data having a state amount or state amounts of one or a plurality of evaluation items; a step for classifying the data acquired from the facility for each operation state of the facility; a step for evaluating the sufficiency of the number of pieces of data for each classified data group; a step for, according to the sufficiency of the number of pieces of data, calculating a plurality of parameter values composing a learning model and holding the parameter values in association with the operation state; a step for acquiring the plurality of parameter values composing the learning model so that the parameter values do not overlap for each of the parameters according to the operation state of data to be diagnosed and a holding state of the parameter values associated with each of the operation states; a step for creating the learning model that diagnoses the data to be diagnosed using the acquired parameter values; a step for calculating a level of abnormality for determining an abnormality on the basis of the learning model; and a step for determining the presence of the abnormality of a diagnosis subject on the basis of the level of abnormality.
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Inventors:
NOZUKI MISA (JP)
MIKI SHINSUKE (JP)
MIKI SHINSUKE (JP)
Application Number:
PCT/JP2022/018740
Publication Date:
November 02, 2023
Filing Date:
April 25, 2022
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05B23/02
Foreign References:
| JP2015172945A | 2015-10-01 | |||
| JP2017207904A | 2017-11-24 | |||
| JP2015181072A | 2015-10-15 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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