Title:
ABNORMALITY MONITORING DEVICE, ABNORMALITY MONITORING METHOD, AND ABNORMALITY MONITORING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/106225
Kind Code:
A1
Abstract:
An abnormality monitoring device 3 has a control unit 71 that, on the basis of a captured image Im that is obtained by imaging a division part of a mold by a camera 60 and a learned model Md that is generated through performing machine learning of learning images showing the division part, determines whether or not the division part is in an abnormal state, and that outputs a stop instruction St for stopping mold closing when determining that the division part is in an abnormal state.
Inventors:
FUJII HIROSHI (TH)
HARA YASUHIKO (JP)
MAKIHARA SHINICHI (TH)
HARA YASUHIKO (JP)
MAKIHARA SHINICHI (TH)
Application Number:
PCT/JP2019/046921
Publication Date:
June 03, 2021
Filing Date:
November 29, 2019
Export Citation:
Assignee:
RYOYO ELECTRO CORP (JP)
International Classes:
B29C45/76
Foreign References:
| JP2005125561A | 2005-05-19 | |||
| JP2019168973A | 2019-10-03 |
Attorney, Agent or Firm:
AXIS PATENT INTERNATIONAL (JP)
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