Title:
ACQUISITION DATA IDENTIFICATION DEVICE, ACQUISITION DATA IDENTIFICATION METHOD, AND ACQUISITION DATA IDENTIFICATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/174527
Kind Code:
A1
Abstract:
A pattern generation unit (21) generates a plurality of patterns for reducing the amounts of a plurality of types of data (31) acquired so that the sum of the amounts of a plurality of types of data acquired from a remotely monitored device (40) during a standard time period is less than a restricted amount. An evaluation data generation unit (22) reduces, for each of the plurality of acquisition patterns, the amounts of a plurality of types of data (31) previously acquired from the monitored device (40), in accordance with the acquisition pattern, thereby generating evaluation data. An accuracy calculation unit (23) calculates, for each of the plurality of acquisition patterns, the accuracy of predicting the state of the monitored device (40) as obtained by applying the evaluation data for the acquisition pattern to a prediction model. A pattern identification unit (24) identifies an acquisition pattern for which the prediction accuracy is high.
Inventors:
FUKUI KOTARO (JP)
GOTO KEI (JP)
GOTO KEI (JP)
Application Number:
PCT/JP2019/007023
Publication Date:
September 03, 2020
Filing Date:
February 25, 2019
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G06Q10/00
Foreign References:
JP2004214785A | 2004-07-29 | |||
JP2015138296A | 2015-07-30 |
Attorney, Agent or Firm:
MIZOI INTERNATIONAL PATENT FIRM (JP)
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