ADDITIONAL LEARNING METHOD FOR DETERIORATION DIAGNOSIS SYSTEM

Title:

ADDITIONAL LEARNING METHOD FOR DETERIORATION DIAGNOSIS SYSTEM

Document Type and Number:

WIPO Patent Application WO/2018/159169

Kind Code:

A1

Abstract:

The present invention creates a determiner DE1 that has learned acceleration measurement data of a facility that reaches a deteriorated state from a normal state and prior label data obtained by giving a label to data which represents a feature of the deterioration in the acceleration measurement data, wherein the acceleration measurement data is acquired by an accelerated deterioration experiment. The present invention acquires measurement data of deterioration diagnosis from the facility in operation, obtains teaching deterioration degree label data from maintenance recording of the facility, and acquires additional data from the measurement data and the teaching deterioration degree label data. The present invention selects, as additional learning data, learning data, when a difference between predicted deterioration degree label data obtained by determining, by the determiner, entire learning data including the additional data, and the teaching deterioration degree label data included in the entire learning data is larger than a prescribed value. The present invention learns the additional learning data and updates the determiner.

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Inventors:

SHIMASAKI NAOFUMI
IKEDA KAZUTAKA

Application Number:

PCT/JP2018/002390

Publication Date:

September 07, 2018

Filing Date:

January 26, 2018

Export Citation:

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Assignee:

PANASONIC IP MAN CO LTD (JP)

International Classes:

G05B23/02

Foreign References:

JP2006163517A	2006-06-22
JPH06331507A	1994-12-02
JPH0269619A	1990-03-08
JPH1049509A	1998-02-20
JP2002189064A	2002-07-05
JP2003156547A	2003-05-30

Other References: