Title:
ADDRESSABLE TEST ARRAY
Document Type and Number:
WIPO Patent Application WO/2024/031797
Kind Code:
A1
Abstract:
An addressable test array, for use in solving the problems of low test structure area utilization rate and low test process time utilization rate. The addressable test array comprises a plurality of addressable on-off controllable low-leakage switches (11), wherein each low-leakage switch (11) comprises: a first MOS transistor (111), the drain end of which is connected to a drain end voltage signal line (12); and a second MOS transistor (112), the drain end of which is connected to a signal protection path (13), the signal protection path (13) being configured to have the same voltage as the drain end voltage signal line. The well end voltages of the first MOS transistor (111) and the second MOS transistor (112) are configured to be equal to the voltage on the signal protection path (13), and the source ends of the first MOS transistor (111) and the second MOS transistor (112) are connected to each other. Each low-leakage switch (11) is configured to: load a first voltage control signal on the gate end of the first MOS transistor (111) so that the first MOS transistor (111) is turned on, and load a second voltage control signal on the gate end of the second MOS transistor (112) so that when the second MOS transistor (112) is turned off, the low-leakage switch (11) is turned on; or load a first voltage control signal on the gate end of the first MOS transistor (111) so that the first MOS transistor (111) is turned off, and load a second voltage control signal on the gate end of the second MOS transistor (112) so that when the second MOS transistor (112) is turned on, the low-leakage switch (11) is turned off.
Inventors:
LIN XI (CN)
SHEN CHEN (CN)
WU HONG (CN)
SHEN CHEN (CN)
WU HONG (CN)
Application Number:
PCT/CN2022/121161
Publication Date:
February 15, 2024
Filing Date:
September 26, 2022
Export Citation:
Assignee:
FABAQUS SHANGHAI SEMICONDUCTOR CO LTD (CN)
International Classes:
G01R31/26; G01R1/20; H01L23/544; H03K17/693
Foreign References:
| CN113791334A | 2021-12-14 | |||
| CN102176440A | 2011-09-07 | |||
| CN103811468A | 2014-05-21 | |||
| CN102176441A | 2011-09-07 | |||
| CN102928763A | 2013-02-13 | |||
| JP2012069601A | 2012-04-05 | |||
| JP2010147224A | 2010-07-01 |
Attorney, Agent or Firm:
SUZHOU 3IN INTELLECTUAL PROPERTY AGENT CO., LTD. (CN)
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