Title:
ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/054073
Kind Code:
A1
Abstract:
The present invention provides an analysis device 100 which analyzes a personalization level indicating a degree of personalization of a software development process. The analysis device 100 is provided with a control unit 1 for receiving metrics information 7 relating to a development process, applying a personalization level prediction model 22 to output a personalization level on the basis of the metrics information to the metrics information 7 to determine the personalization level.
Inventors:
OKA AIKO (JP)
Application Number:
PCT/JP2018/034281
Publication Date:
March 19, 2020
Filing Date:
September 14, 2018
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G06F8/77
Foreign References:
| JP2015014856A | 2015-01-22 | |||
| JP2003157345A | 2003-05-30 |
Other References:
MUNAKATA SATOSHI ET AL.: "Introduction of project risk identification focusing on standard risks of software development", HITACHI EAST JAPAN SOLUTIONS TECHNICAL REPORT, no. 13, 1 November 2007 (2007-11-01), pages 20 - 24
SASAGAWA FUMIYOSHI: "Approach to the technology that supports software coat estimation by risk level presumption based on machine learning", IPSJ SIG TECHNICAL REPORT, vol. 2006, no. 48, 17 May 2006 (2006-05-17), pages 25 - 32
SASAGAWA FUMIYOSHI: "Approach to the technology that supports software coat estimation by risk level presumption based on machine learning", IPSJ SIG TECHNICAL REPORT, vol. 2006, no. 48, 17 May 2006 (2006-05-17), pages 25 - 32
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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