Title:
ANALYSIS DEVICE, ANALYSIS METHOD, AND ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/261487
Kind Code:
A1
Abstract:
This analysis device analyzes a control program group which controls operations of a plurality of devices included in a production line. The control program group includes a plurality of variables. The plurality of variables includes first and second device variables which respectively correspond to first and second devices, and other accessible variables in two or more files. The analysis device includes an acquisition unit, an analysis unit, and a specification unit. The acquisition unit acquires the control program group. The analysis unit analyzes any of files to extract information that can specify first dependency from the first device variable to the other variable, and analyzes one or a plurality of other files to extract information that can specify second dependency from the other variable to the second device variable. The specification unit specifies dependency from the first device variable to the second device variable on the basis of the first and second dependencies.
Inventors:
OTA YUYA (JP)
HATTORI REIKO (JP)
TSURUTA KOSUKE (JP)
HATTORI REIKO (JP)
TSURUTA KOSUKE (JP)
Application Number:
PCT/JP2019/025596
Publication Date:
December 30, 2020
Filing Date:
June 27, 2019
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G05B19/05
Domestic Patent References:
| WO2012011145A1 | 2012-01-26 | |||
| WO2014097379A1 | 2014-06-26 |
Foreign References:
| JP2013225251A | 2013-10-31 | |||
| JP2018206362A | 2018-12-27 | |||
| JP2016076080A | 2016-05-12 | |||
| JP2010282441A | 2010-12-16 | |||
| JP2013156802A | 2013-08-15 |
Attorney, Agent or Firm:
TACHIBANA, Kenji et al. (JP)
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