Title:
ANALYSIS DEVICE AND ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2023/120231
Kind Code:
A1
Abstract:
The present invention makes it possible to analyze a plurality of components to be measured in a sample while simplifying an optical system, and provides an analysis device 100 that analyzes the concentration of components to be measured in the sample, the analysis device 100 comprising: a measuring cell 2 into which the sample is introduced; a light source 3 that irradiates the measuring cell 2 with light; a photodetector 4 that detects the light transmitted through the measuring cell 2; a variable filter 5 that is provided between the measuring cell 2 and the light source 3 or the photodetector 4, and changes the transmission wavelength depending on the light incident position; a filter moving mechanism 6 that moves the variable filter 5 to change the wavelength of light detected by the photodetector 4; and a concentration calculation unit 7 that calculates, on the basis of a detection signal of the photodetector 4, the concentration of the components to be measured.
Inventors:
ISHIDA KENTARO (JP)
OIDA TAKUJI (JP)
OIDA TAKUJI (JP)
Application Number:
PCT/JP2022/045406
Publication Date:
June 29, 2023
Filing Date:
December 09, 2022
Export Citation:
Assignee:
HORIBA LTD (JP)
International Classes:
G01N21/3504
Foreign References:
JP2017523400A | 2017-08-17 | |||
JPS5030580A | 1975-03-26 | |||
US20170059476A1 | 2017-03-02 | |||
JP2002507739A | 2002-03-12 | |||
JP2003057178A | 2003-02-26 | |||
JP2004226097A | 2004-08-12 | |||
US20190187051A1 | 2019-06-20 |
Attorney, Agent or Firm:
NISHIMURA, Ryuhei et al. (JP)
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