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Patent Searching and Data


Title:
ANALYZING DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/037674
Kind Code:
A1
Abstract:
This analyzing device comprises a sample accommodating compartment (20) which has an opening and closing portion (24) and which is internally provided with an internal placement platform (21) for accepting a sample accommodating portion (90) by way of the opening and closing portion (24), and a sample insertion portion (10) for inserting the sample accommodating portion (90) into the sample accommodating compartment (20), wherein: the sample accommodating portion (90) has a surface direction and includes a flange provided on an end portion in the surface direction; and the sample insertion portion (10) comprises an external placement platform (11) which is provided outside the sample accommodating compartment (20) and which has a top surface, a moving platform (12) which is provided on the top surface of the external placement platform (11) so as to be capable of moving between a first position that is farther away relative to the internal placement platform (21) and a second position that is closer relative to the internal placement platform (21), and which has an engaging portion (13) that engages with the flange of the sample accommodating portion (90), and a drive portion which moves the moving platform (12) and which changes the state of engagement between the flange of the sample insertion portion (90) and the engaging portion (13) of the moving platform (12).

Inventors:
TOMONO TAICHI (JP)
MIZUSHIMA HIROSHI (JP)
NAKATSUKA KIYOKAZU (JP)
Application Number:
PCT/JP2022/022521
Publication Date:
March 16, 2023
Filing Date:
June 02, 2022
Export Citation:
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Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N35/04; G01N35/00
Domestic Patent References:
WO2020039558A12020-02-27
WO2020090159A12020-05-07
Foreign References:
JP2004180675A2004-07-02
JP2008533989A2008-08-28
US5416329A1995-05-16
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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