ANOMALY DETECTION SYSTEM, LEARNING DEVICE, ANOMALY DETECTION PROGRAM, AND LEARNING PROGRAM

WIPO Patent Application WO/2022/137841

A1

The present invention ensures stable determination accuracy irrespective of image size during anomaly detection for detecting a defect in the appearance of an object.　An anomaly detection system 100 comprises: an input unit 111 that inputs inspection images of a target object which have a plurality of types of image sizes greater than or equal to a prescribed size; a feature extraction unit 201 that has been trained in advance to extract a feature map 355 from training images including non-defective images of the target object; an image generation unit 202 that has been trained in advance to restore the training images from the feature map 355 extracted by the feature extraction unit 201; and a detection unit 116. The detection unit 116 detects an anomaly in the target object to be inspected on the basis of similarity calculated by comparing, with restoration images of the inspection images restored by the feature extraction unit 201 and the image generation unit 202, the inspection images of the target object, which have been input to the input unit 111 and which have the plurality of types of image sizes greater than or equal to the prescribed size.

OKUNO KIICHI (JP)
OKAZAKI TOMOYA (JP)
SASHIDA TAKEHIKO (JP)
TACHI KOKI (JP)

PCT/JP2021/040920

June 30, 2022

November 08, 2021

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KONICA MINOLTA INC (JP)

G01N21/88; G06T7/00

JP2019522897A	2019-08-15
JP2017097718A	2017-06-01
JP2020181532A	2020-11-05
JP2019069145A	2019-05-09
CN109615604A	2019-04-12

HATTA & ASSOCIATES (JP)

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