Title:
APERTURE DETECTOR AND APERTURE DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2007/063575
Kind Code:
A1
Abstract:
An aperture detector for detecting an aperture (13) formed in a test object (12)
comprises a jet sleeve (28) that faces one side of the test object (12) and jet out
a pressurized fluid toward the one side of the test object (12), a temperature
sensor (20) that faces the other side of the test object (12) the one side of which
is under the fluid pressure applied by the jet sleeve (28), and a processor (38)
that processes a signal from the temperature sensor (20). The processor (38)
detects the aperture (13) according to the difference between a signal when the
fluid passing through the aperture (13) acts on the temperature sensor (20) and
a signal when the fluid cannot pass through the aperture (13).
Inventors:
SAKAI KOJI (JP)
AOKI SHIGERU (JP)
GRAM ANDERS (JP)
YOSHITOME MASASHI (JP)
AOKI SHIGERU (JP)
GRAM ANDERS (JP)
YOSHITOME MASASHI (JP)
Application Number:
PCT/JP2005/021875
Publication Date:
June 07, 2007
Filing Date:
November 29, 2005
Export Citation:
Assignee:
KANTUM ELECTRONICS CO LTD (JP)
SAKAI KOJI (JP)
AOKI SHIGERU (JP)
GRAM ANDERS (JP)
YOSHITOME MASASHI (JP)
SAKAI KOJI (JP)
AOKI SHIGERU (JP)
GRAM ANDERS (JP)
YOSHITOME MASASHI (JP)
International Classes:
G01M3/02; G01B13/00
Foreign References:
JPS5921705U | 1984-02-09 | |||
JP2002162271A | 2002-06-07 | |||
JP2005024486A | 2005-01-27 | |||
JPS5922482Y2 | 1984-07-05 | |||
JPH09159577A | 1997-06-20 | |||
JP2005195525A | 2005-07-21 |
Attorney, Agent or Firm:
ISHIDO, Hisako (Sanno Urban Life 1-8, Sanno 2-chom, Ota-ku Tokyo 23, JP)
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