Title:
APPARATUS FOR DETECTING UNEVENNESS IN THICKNESS OF THREAD
Document Type and Number:
WIPO Patent Application WO/1984/001622
Kind Code:
A1
Abstract:
An apparatus photoelectrically detects any unevenness in the thickness of a thread formed of silver, roving or yarn, independently of environmental conditions such as temperature. A light-emitting element is provided with two light-beam outlets, and two light-receiving elements are arranged so as to correspond to the ligh-beam outlets. In this case, the light beams from one of the light-beam outlets reaches the corresponding light-receiving element through a thread, while the light beams from the other light-beam outlet reaches the other light-receiving element directly. The two light-receiving elements are positioned within the same environment, and the difference in the quantity of light received by the two light-receiving elements is employed to detect unevenness in the thickness of the thread.
Inventors:
NISHITANI KIMIO (JP)
Application Number:
PCT/JP1983/000343
Publication Date:
April 26, 1984
Filing Date:
October 13, 1983
Export Citation:
Assignee:
AICHI SPINNING CO (JP)
International Classes:
G01B11/08; B65H63/06; G01B11/00; G01B11/10; G01N33/36; (IPC1-7): G01B11/08
Foreign References:
| JPS50115854A | 1975-09-10 | |||
| JPS5317513B2 | 1978-06-08 | |||
| JPS556163B2 | 1980-02-14 | |||
| JPS52134466A | 1977-11-10 | |||
| JPS4843655A | 1973-06-23 | |||
| JPS4716861B2 |
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