APPARATUS AND METHOD FOR BALLISTIC TESTING

FIELD

[0001] The present disclosure broadly relates to an apparatus and method for ballistic testing. More specifically but not exclusively, the present disclosure relates to an apparatus and method for aligning a test point on a surface of a test object with a ballistic path.

BACKGROUND

[0002] The following is not an admission that anything discussed below is part of the prior art or part of the common general knowledge of a person skilled in the art.

[0003] Ballistic testing is an important aspect in the development of various products, for example military equipment. Such testing often involves precisely aligning a test point on a test object with the path to be traveled by a ballistic projectile. In this way, the durability and safety of specific components or areas of the test object can be accurately tested. Furthermore, in addition to aligning a test point with a ballistic path, it may also be required that the surface of the test object be oriented at a precise angle with respect to the ballistic path.

[0004] Currently available systems for carrying out ballistic testing are often difficult and tedious to use. This is due to the requirement of precisely aligning a test point on a test object with a ballistic path, which often requires multiple adjustments of the positioning and/or orientation of the test object relative to the ballistic path. Where multiple points on a test object need to be tested, the number of adjustments increases accordingly.

SUMMARY

[0005] The present disclosure broadly relates to an apparatus and method for ballistic testing. In an aspect, the present disclosure includes an apparatus and method for rapidly and accurately aligning a test point on a surface of a test object with a ballistic path.

[0006] In an aspect, the present disclosure includes an apparatus (10) for positioning a test object (12) for ballistic testing, the apparatus comprising:

a movable support (40) for supporting the test object (12);

a pointer (42) for defining an impact point on the test object;

a primary position adjustment assembly (18) in operative communication with the movable support (40), the primary position adjustment assembly (18) defining a primary horizontal axis (P _x ), a primary vertical axis (P _y ) and a z axis, the primary position adjustment assembly providing for selectively adjusting the position of the movable support (40) and test object (12) along the P _x , P _y and z axes; and a secondary position adjustment assembly (20) in operative communication with the movable support (40), the secondary position adjustment assembly (20) defining a secondary horizontal axis (S _x ) and a secondary vertical axis (S _y ), the secondary position adjustment assembly (20) providing for selectively adjusting the position of the movable support (40) and the test object (12) along the S _x and S _y axes,

wherein selective adjustment of the movable support (40) and the test object (12) along the P _x , P _y , z, S _x , and S _y axes provides for co-locating a test point on a surface of the test object (12) with the impact point.

[0007] In an embodiment, the primary position adjustment assembly (18) provides for rotating the support (40) and the test object (12) about the primary horizontal axis (Px) and for simultaneously linearly displacing the support (40) and the test object (12) along the primary vertical axis (Py) and the z-axis.

[0008] In an embodiment, the secondary position adjustment assembly (20) provides for rotating the support (40) and the test object (12) about the secondary horizontal axis (Sx) and for rotating the support (40) and the test object (12) along the secondary vertical axis (Sy). [0009] In an embodiment, the support (40) is mounted to the primary position adjustment assembly (18), the secondary position adjustment assembly (20) being in operative communication with the primary position adjustment assembly (18) for imparting a pivot movement thereto for rotating the support (40) and the test object (12) about the S _x axis.

[0010] In an embodiment, the secondary position adjustment assembly (20) comprises a first secondary position adjusting element providing for imparting a second pivot movement to the primary position adjustment assembly (18) for rotating the support (40) and the test object (12) about the S _y axis.

[0011] In an embodiment, the primary position adjustment assembly (18) further comprises a pivotable support assembly (22) pivotably mounted to a top end of an upright bracket (24), the support being mounted to the pivotable support assembly (22) , the secondary position adjustment assembly (20) providing for imparting a pivot movement to the pivotable support assembly (22) about the top end of the bracket for rotating the support and the test object about the S _x axis.

[0012] In an embodiment, the secondary position adjustment assembly (20) comprises a second secondary position adjusting element providing for imparting a pivot movement to the pivotable support assembly (22) about the S _x axis.

[0013] In an embodiment, the P _x axis is offset from the impact point.

[0014] In an embodiment, rotating the support about the S _x and S _y axes after co-locating the test point and the impact point maintains co-location of the test point with the impact point.

[0015] In an embodiment, the S _x and S _y axes are mutually perpendicular.

[0016] In an aspect, the present disclosure includes a ballistic test system comprising:

an apparatus (10) for positioning a test object (12) for ballistic testing, the apparatus comprising: a movable support (40) for supporting the test object (12); a pointer (42) for defining an impact point on the test object; a primary position adjustment assembly (18) in operative communication with the movable support (40), the primary position adjustment assembly (18) defining a primary horizontal axis (P _x ), a primary vertical axis (P _y ) and a z axis, the primary position adjustment assembly providing for selectively adjusting the position of the movable support (40) and test object (12) along the P _x , P _y and z axes; and

a secondary position adjustment assembly (20) in operative communication with the movable support (40), the secondary position adjustment assembly (20) defining a secondary horizontal axis (S _x ) and a secondary vertical axis (S _y ), the secondary position adjustment assembly (20) providing for selectively adjusting the position of the movable support (40) and the test object (12) along the S _x and S _y axes,

wherein selective adjustment of the movable support (40) and the test object (12) along the P _x , P _y , z, S _x , and S _y axes provides for co-locating a test point on a surface of the test object (12) with the impact point;

an optical transmitter for transmitting a light beam; and

an optical receiver for receiving the light beam.

[0017] In an embodiment, the ballistic test system further comprising a reflector (200) having a planar reflective surface (202), the reflector (200) being operable to orient the planar reflective surface (202) tangentially with the surface of the test object at the test point.

[0018] In an embodiment, the optical transmitter transmits a light beam along a ballistic path;

wherein the optical receiver is aligned with the ballistic path; and

wherein receiving a reflected light beam at the optical receiver indicates perpendicular orientation of the ballistic path with the surface of the test object at the test point. [0019] In an aspect, the present disclosure includes a method for positioning a test object for ballistic testing, the method comprising:

defining an impact point on the test object along a ballistic path; defining a primary horizontal axis (Px), a primary vertical axis (Py), a z axis, a secondary horizontal axis (Sx) and a secondary vertical axis (Sy);

selectively adjusting the position of the test object along the P _y and z axes and about the P _x , S _x and S _y axes, thereby co-locating a test point on the test object with the impact point; and

adjusting an angle of incidence of the ballistic path with the surface of the test object at the test point.

[0020] In an embodiment, co-locating the test point on the test object with the impact point comprises linearly displacing of the test object along the P _y and z axes.

[0021] In an embodiment, co-locating the test point on the test object with the impact point comprises rotating the test object about the P _x axis, wherein the P _x axis is offset from the impact point.

[0022] In an embodiment, adjusting comprises rotating the test object about at least one of the S _x and S _y axes, the S _x and S _y axes being each aligned with the impact point.

[0023] In an embodiment, the method for positioning a test object for ballistic testing further comprises positioning a reflective surface at the test point of the test object; transmitting a light beam towards the reflective surface; and receiving at an optical receiver a reflected light beam corresponding to the transmitted light beam reflecting off the reflective surface.

[0024] In an embodiment, the light beam is transmitted along the ballistic path towards the reflective surface, the optical receiver is aligned with the ballistic path; such that .receiving the reflected light beam at the optical receiver indicates perpendicular orientation of the ballistic path with the surface of the test object at the test point. [0025] The foregoing and other advantages and features of the present disclosure will become more apparent upon reading of the following non-restrictive description of illustrative embodiments thereof, given by way of example only with reference to the accompanying drawings/figures.

BRIEF DESCRIPTION OF THE DRAWINGS/FIGURES

[0026] In the appended drawings/figures:

[0027] FIG. 1 illustrates a perspective view of an apparatus for positioning a test object in accordance with an embodiment of the present disclosure.

[0028] FIG. 2 illustrates a side elevation view of an apparatus for positioning a test object in accordance with an embodiment of the present disclosure.

[0029] FIG. 3A illustrates a perspective view of an apparatus for positioning a test object in accordance with an embodiment of the present disclosure wherein the pointer is in a detached position.

[0030] FIG. 3B illustrates a perspective view of an expanded portion of an apparatus for positioning a test object in accordance with an embodiment of the present disclosure wherein the pointer is in an attached position.

[0031] FIG. 4 illustrates a perspective view of the primary adjustment assembly of the apparatus for positioning a test object in accordance with an embodiment of the present disclosure.

[0032] FIG. 5A illustrates a perspective view of the reflector in accordance with an embodiment of the present disclosure.

[0033] FIG. 5B illustrates a sectional view of the reflector in accordance with an embodiment of the present disclosure.

[0034] FIG. 6 illustrates a ballistic test system in accordance with an embodiment of the present disclosure. DETAILED DESCRIPTION

[0035] It will be appreciated that, for simplicity and clarity of illustration, where considered appropriate, reference numerals may be repeated among the figures to indicate corresponding or analogous elements or steps. In addition, numerous details are set forth in order to provide a thorough understanding of the exemplary embodiments described herein. However, it will be understood by those of ordinary skill in the art that the embodiments described herein may be practiced without these specific details. In other instances, well-known methods, procedures and components have not been described in detail so as not to obscure the embodiments described herein. Furthermore, this description is not to be considered as limiting the scope of the embodiments described herein in any way but rather as merely describing the implementation of the various embodiments described herein.

[0036] With the reference to FIGS 1 and 2, there is shown is an apparatus 10 for aligning a test point on a surface of a test object 12 with a ballistic path according to an exemplary embodiment. For example, the test object 12 is illustrated herein as being a helmet, but it will be understood that various other objects may also be used as a test object 2.

[0037] The apparatus 10 is adapted to secure the test object 12 even when a large force (e.g. the impact of a projectile thereon) is exerted on the test object 12. Apparatus 10 provides for defining an impact point on the test object 12. The expression "impact point" refers to a point where the projectile used in the ballistic test is expected to impact the test object 12. For example, the impact point is located along a ballistic path to be traveled by the projectile. To ensure that the projectile will precisely impact the test object 12 at a desired test point, the test object 12 should be appropriately positioned so that the impact point and the test point are co-located.

[0038] As such, and as will be described below, the apparatus 10 provides for adjusting the position of the test object 12 along a primary horizontal axis P _x (see

Fig. 4), a primary vertical axis P _y (see Fig. 4) and along the z-axis (see FIG. 3A), a secondary horizontal axis S _x (see FIGS. 1 , 3A and 3B), and secondary vertical axis S _y (see Figs. 1 and 3B). As will be discussed herein, the position of the test object 12 is adjusted along the primary horizontal and vertical axis P _x and P _y respectively, by way of a primary position adjustment assembly 18 and along the secondary horizontal and vertical axis S _x and S _y respectively, by way of a secondary position adjustment assembly 20.

[0039] The apparatus 10 is shown including a position adjustment device 14 supported on a base 16. Of course, in another non-illustrated embodiment, the apparatus 10 may only include the position adjustment device 14 without a base 16 and as such the apparatus 10 in this case is the position adjustment device 14.

[0040] The position adjustment device 14 includes the primary position adjustment assembly 18 and the secondary position adjustment assembly 20 which are in operative communication with each other as will be discussed be!ow. As mentioned above, the primary position adjustment assembly 18 provides for adjusting the position of the test object 12 along the primary horizontal and vertical axes, Px and Py respectively, as well as the z axis, and the secondary position adjustment assembly 20 provides for adjusting the position of the test object 12 along the secondary horizontal and vertical axes, Sx and Sy.

[0041] The primary position adjustment assembly 18 is shown having a pivotable support assembly 22 pivotably mounted to a bracket 24. The secondary position adjustment assembly 20 includes a first secondary position adjusting element, shown here in the form of a rotating plate member 26 mounted to a support table 28 of the base 16. The bracket 24 is upstanding from the rotating plate member 26 for operative communication therewith. The secondary position adjustment assembly 20 also includes a second secondary position adjusting element, shown here in the form of an extensible actuator 30 mounted to the rotating plate member 26, and is operationally connected to the pivotable support assembly 22 for imparting a pivot movement thereto.

[0042] The pivotable support assembly 22 includes a pair of spaced apart plates 34. Each plate member 34 is hinged to a respective upright member 36 of the bracket 24 at a respective hinge 37. The pivotable support assembly 22 includes an adjustment device 38 including an object support 40 (see FIGS 3A and 4) on which the object 12 is mounted to. The adjustment device 38 is mounted to the plates 34.

[0043] With reference to FIGS 1 , 2 and 4, the adjustment device 38 provides for adjusting the position of the test object 12 along the primary axes P _x and P _y and the z-axis. More particularly, the adjustment device 38 provides for rotating the test object 12 about axis P _x and displacing the test abject along axis P _y and the z-axis.

[0044] Turning now to FIGS 3A and 3B, the impact point will now be discussed. In this non-limiting example, there is shown a pointer 42 positioned on the top of upright members 36 of the bracket 24 (FIG. 3B) and includes a pointing member 44 having a pointed end 46. As will be further detailed below when discussing FIG. 6, the pointed end 46 defines an impact point on the test object 12 when the test object 12 is appropriately positioned on the apparatuslO. The pointing member 44 may be coupled onto a mounting member 48, which may further have one or more fasteners 50. The mounting member 48 and fasteners 50 enable the pointer 42 to be removably coupled to the apparatus 10.

[0045] The adjustment device 38 provides for co-locating a desired test point on the surface of the test object 12 with the impact point. Therefore, when initially placing the test object on the support 40 and noticing a discrepancy between a desired test point and the above-mentioned impact point, the user may correct this discrepancy via the adjustment device 38.

[0046] Returning now to FIGS 3A and 4, the support 40 includes a plurality of fasteners, such as clamps 52. For example, the clamps 52 may be used to directly secure the test object 12 or they may be used to secure an intermediate securing device 54. The intermediate securing device 54 may function as an adapter for securing various types of test objects to apparatus 10. For example, and as illustrated, the intermediate securing device 54 includes a base member 56 to which are coupled a plurality of clamps 58. As further illustrated, the base member 56 and the clamps 58 are appropriately sized to securely retain a test object 12. [0047] With reference to FIGs 3A and 3B, the plates 34 define respective slots 60 which define a displacement path for support 40 along the axis P _y and the z-axis. In this example, the slots 60 are linear and therefore the displacement path defined thereby is also linear.

[0048] Referring to FIG. 4, the adjustment device 38 includes a movable rack 62 movably mounted to the plates 34 so as to slidably move along the slots 60. The support 40 is mounted to the movable rack 62 thereby also movable along the displacement path defined by the slots 60. In this example, the movable rack 62 includes a transverse member 64, on which the support 40 is directly mounted to. The transverse member 64 includes a clamp 66 at each opposite longitudinal end thereof. Each clamp 66 clamps a respective plate 34 on each lateral face thereof about the slot 60. Each clamp 66 is further mounted to a respective rod 68 positioned on the outer lateral face of each plate 34. Each rod 68 is oriented along the displacement path defined by slot 60. As such, the clamps 66 move along the rods 68. A handle 70 is coupled to each clamp 66 for clamping and unclamping the rod 68 in order to allow movement of each clamp 66 along the rod 68. Thus, the user may selectively position the support 40 at a predetermined position along the displacement path defined by the slots 60.

[0049] Referring again to FIGs 3A, 3B and 4, the movable rack 62 includes a pair of end plates 72. Each end plate 72 is movably mounted to a respective inner lateral face of a respective plate 34. The transverse member 64 is movably mounted at each end thereof to a respective end plate 72. Each end plate 72 includes a respective curved slot 74 defining a curved path. The transverse member 64 moves along slots 74. As such, the support 40 mounted to the transverse member 64 moves along a curved path defined by the slots 74 thus rotating about axis P _x . A handle 76 is coupled to each end plate 72 for clamping and unclamping the ends of the transverse member 64 on the end plates 72 in order to selectively allow movement along the slots 74 and thus allowing the user to position the support 40 at a predetermined position along the curved path defined by slots 74. [0050] The transverse member 64 also includes a transverse slot 78 for providing the support 40 to slidably move along the displacement path defined by the slot 78. A handle 80 coupled to the support 40 and the transverse 64 provides for selectively securing the support 40 at any predetermined position along the transverse slot 78. As such, the position of support 40 can be selectively adjusted along axis P _x .

[0051] Referring now to FIGS 1 , 2, 3, 3A and 3B, the secondary position adjustment assembly 20 of apparatus 10 will now be described.

[0052] As previously mentioned, the secondary position adjustment assembly 20 is adapted to rotate the support 40 and the test object 12 about axis S _x and S _y which are perpendicular to each other. It should be noted that the impact point should be aligned with the intersecting point of axes S _x and S _y . The support 40 and test object 12 are adjusted about axis S _x and S _y so that the test point is co-located with the impact point.

[0053] As previously mentioned, the secondary position adjustment assembly 20 includes a rotating plate member 26 mounted to the support table 28, and the bracket 24 is upstanding therefrom.

[0054] The plate member 26 is pivotably mounted to table 28 about pivot 80 which defines the pivot axis S _y . As such the plate member 26 rotates about pivot 80. The rotating plate 26 may include a guide slot 82 having a curved configuration in order to allow a rotating or pivoting movement about pivot 80.

[0055] In an embodiment, a movement imparting mechanism 84 (FIG. 3) can be mounted to base 16 for rotating the plate member 26 about pivot 80. The movement imparting mechanism 84 may be hand-operated or motorized. In one example, movement imparting mechanism 84 includes a handle 86 that may be turned to cause the rotating plate 26 to be rotated about pivot 80. As such, mechanism 84 may include a gearing system (not shown but well understood in the art) for imparting a rotational movement to the rotating plate 26. [0056] As such, the rotating plate member 26 which acts as the first secondary position adjusting element, as mentioned above, adjusts the position of the support 40 and test object 12 about axis S _y .

[0057] As previously mentioned, the secondary position adjustment assembly 20 also includes a second secondary position adjusting element, exemplified here as an extensible actuator 30 for imparting a pivot movement to the pivotable support assembly 22 about hinges 37. Hinges 37 define axis S _x and as such, the extensible actuator 30 provides for rotating the support 40 and test object 12 about axis S _x .

[0058] A transverse member 88 is interposed and mounted to the plate members 34. The extensible actuator 30 includes an extensible rod 90 connected to the transverse member 88 and operated by a handle 92 mounted to a support 94 upstanding from the rotating plate 26.

[0059] Extension or retraction of the extensible rod 90 will cause the pair of opposing plate members 34 and the support 40 (as well as the test object 12) to rotate about S _x . The handle 92 may be hand operated, alternatively a motorized mechanism may be used to reciprocally extend and retract the extensible rod 90. Since the extensible rod 90 is coupled to the first secondary position adjustment element (e.g. rotating plate 26), the perpendicular orientation of the extensible rod 90 relative to axis S _x is maintained as rotating plate 26 is rotated about axis S _y . It will be appreciated that rotation of the rotating plate 26, about axis S _y by a given angle will cause axis S _x and the extensible rod 90 to each be rotated by the same angle.

[0060] Turning back to FIG. 1 , the base 16 may have wheels 96 permitting displacement of the positioning apparatus 10. As illustrated, the wheels 96 are rail wheels for displacement of the base 16 and the positioning apparatus 10 along a system of rail tracks. Base 16 comprises one or more legs 98 for adjusting the height of the apparatus 10 supported thereon.

[0061] Referring now to FIGS. 5A and 5B, therein illustrated is a perspective view (FIG. 5A) and a sectional view (FIG. 5B) of a reflector 200 adapted to be coupled to the surface of the test object 12. In particular, reflector 200 can be coupled to the surface of the test object 12 such that a planar reflective surface 202 of the reflector 200 is oriented tangentially to the surface of the test object 12 at the test point. The reflector 200 includes a body 204 having an internal bore 206. The planar reflective surface 202 is coupled to a first end of the body 204. A second end of the body 204 includes an opening of the internal bore 206. The second end of body 206 further includes a plurality of circumferentially distributed legs 208 which define a recess 210 at the second end of body 204. For example, and as illustrated, the planar reflective surface 202 includes an annular rim 212 having internal threads for engaging cooperating threads of the first end of the outer surface of body 204. The threaded relationship of the annular rim 212 and body 204 allows the planar reflecting surface 202 to be removed from body 204 when no longer needed. A member 214 is disposed within the internal bore 206 of body 204. A pointed end 216 of member 214 projects through the opening at the second end of body 204 and occupies the recess 210. The pointed end 216 is shown as positioned at the center of the second end of body 204. The reflector 200 further includes a biasing member 218 disposed within the internal bore 206 and abutting a blunt end 220 of member 214. As shown, an opposite end of the biasing member 218 may be abutting against an internal surface 222 of planar reflective surface 202. The biasing member 218 urges the member 214 away from the first end of body 204 and towards the open second end of the body 204 such that the pointed end 216 extends from the recess 210. For example, the pointed end 216 of member 214 may extend axially past the second end of body 204. The extent of the extension may be adjusted according to how tightly the annular rim 212 and the reflecting surface 202 are screwed about the threaded outer surface of the first end of body 204.

[0062] In use, the pointed end 216 of member 214 is aligned with a desired test point on the surface of test object 12. Positioning the pointed end 216 of member 214 on a test point of test object 12, followed by the application of a sufficient amount of force, results in the biasing member 218 being compressed {i.e. pushed inward) with the concomitant inward movement of member 214 into recess 210. Movement of member 214 into recess 210 and bore 206 results in the legs 208 abutting the surface of test object 12. Abutment of the legs 208 of reflector 200 against the surface of the test object 12, results in the planar reflective surface 202 of reflector 200 being oriented tangentially to the surface of the test object 12 at the test point.

[0063] Referring now to FIG. 6 and according to various non-limiting embodiments for aligning a test point on the surface of a test object 12 with an impact point, the ballistic path travelled by a ballistic projectile is first determined. The ballistic path can be determined using a laser 300. The laser 300 emitting a laser beam 302 is pointed at the test object 12. The laser 300 emitting a laser beam 302 may be pointed at the test object 12 through a gun barrel 306. An impact point along the ballistic path is thus determined. The impact point can also be determined by attaching the pointer 42 to apparatus 10 such that the impact point is defined by the pointed end 46 of pointer 42. In this embodiment, the pointed end 46 of the pointing member 44 is aligned with the ballistic path.

[0064] A desired test point on the surface of the test object 12 is then co- located with the impact point. For example, the test object 12 is displaced using the primary position adjustment assembly 18 and/or the secondary position adjustment assembly 20 to co-locate the test point with the impact point. For example, when using apparatus 10, the test object 12 is typically secured to support 40. The position of the test object 12 is then adjusted by adjustment device 38. For example, the support 40 may be displaced in a first direction along slots 60 of the plate members 34, displaced in a second direction along the transverse slot 78 of the transverse member 64, and/or displaced along the curved path defined by the slots 74. It is understood that the aforementioned movements of the support 40 result in a corresponding movement of the test object 12 mounted thereon.

[0065] After co-locating the test point on the surface of the test object 12 with the impact point, the angle of incidence of the ballistic path with the surface of the test object 12 at the test point can be adjusted while maintaining alignment of the test point with the ballistic path. For example, the angle of incidence can be adjusted by rotating the test object 12 about secondary horizontal and vertical axis S _x and S _y respectively, by way of the secondary position adjustment assembly 20. For example, when using apparatus 10, movement ^' imparting mechanism 84 causes rotation of the support 40 about secondary vertical axis S _y . A second movement imparting mechanism 91 causes rotation of the support 40 about secondary horizontal axis S _x .

[0066] According to various exemplary embodiments where the angle of incidence is adjusted so that the surface of the test object 12 at the test point is perpendicular to the ballistic path, a planar reflecting surface 202 is positioned at the test point and oriented tangentially to the surface of the test object 12. The planar reflecting surface 202 can be positioned and oriented prior to adjusting the angle of incidence of the ballistic path with the surface of the test object 12 at the test point. According to various exemplary embodiments, after co-locating the test point with the impact point, the pointer 42 is detached from the apparatus 10, thereby freeing the space near the test point of the test object 12. The pointed end 216 of member 214 is then aligned with the test point on the surface of the test object 12 followed by the application of a sufficient amount of force resulting in the biasing member 218 being compressed {i.e. pushed inward) with the concomitant inward movement of member 214 into recess 210. Movement of member 214 into recess 210 and bore 206 results in the legs 208 abutting the surface of test object 12. Abutment of the legs 208 against the surface of the test object 12, results in the planar reflective surface 202 of reflector 200 being oriented tangentially to the surface of the test object 12 at the test point.

[0067] Turning back to FIG. 6, when the planar reflecting surface 202 is oriented tangentially with the surface of the test object 12 at the test point, a light beam (e.g. a laser beam 302) is transmitted towards the reflective surface. For example, the light beam may be a laser or other light source having high coherency. An optical receiver 304 is further provided to receive a reflected light beam corresponding to the transmitted light beam being reflected by the reflective surface 202. The light transmitter (e.g. laser 300) for transmitting the light beam and the optical receiver 304 for receiving the reflected light beam are appropriately positioned such that receiving the reflected light beam at the optical receiver 304 provides an indication of the angle of incidence of the ballistic path with the surface of the test object 12 at the test point. For example, a light transmitter T and a optical receiver R may be appropriately positioned to define a first angle formed by the light transmitter T, reflective surface S, and ballistic path P (Angle TSP) and a second angle formed by the optical receiver R, reflective surface S, and ballistic path P (Angle RSP). For example, where angle TSP and angle RSP are both 45°, receiving the reflected light beam at the optical receiver R indicates that the reflective surface S has been oriented perpendicularly to the ballistic path. According to an embodiment, the light transmitter may be aligned with the ballistic path and transmits the light beam along the ballistic path (i.e. Angle TSP = 0°) and the light receiver is also aligned with the ballistic path (i.e. Angle RSP = 0°). Accordingly, receiving the reflected light beam at the optical receiver R will also indicate that the reflective surface S has been oriented perpendicularly to the ballistic path.

[0068] While the above description provides examples of the embodiments, it will be appreciated that some features and/or functions of the described embodiments are susceptible to modification without departing from the spirit and principles of operation of the described embodiments. Accordingly, what has been described above has been intended to be illustrative and non-limiting and it will be understood by persons skilled in the art that other variants and modifications may be made without departing from the scope of the invention as defined in the claims appended hereto.