Title:
APPEARANCE INSPECTING DEVICE AND APPEARANCE INSPECTING METHOD
Document Type and Number:
WIPO Patent Application WO/2023/026699
Kind Code:
A1
Abstract:
This appearance inspecting device: detects a defect candidate in each captured image of a crown surface of a piston captured at a plurality of mutually different attitude angles; obtains a three-dimensional position of the defect candidate on the basis of a two-dimensional position of the defect candidate detected from at least one captured image among the captured images captured at the plurality of attitude angles; performs a perspective projection transformation of the three-dimensional position of the defect candidate to acquire a two-dimensional position of the defect candidate in each captured image captured at the plurality of attitude angles; obtains a feature quantity relating to the defect candidate on the basis of the two-dimensional position of the defect candidate in each captured image captured at the plurality of attitude angles; and inspects the crown surface of the piston using the feature quantity relating to the defect candidate.
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Inventors:
INOUE SHINICHI (JP)
SEKI TAKATERU (JP)
IMAIZUMI TAKAMASA (JP)
HAYASHI HIROYUKI (JP)
SEKI TAKATERU (JP)
IMAIZUMI TAKAMASA (JP)
HAYASHI HIROYUKI (JP)
Application Number:
PCT/JP2022/026939
Publication Date:
March 02, 2023
Filing Date:
July 07, 2022
Export Citation:
Assignee:
HITACHI ASTEMO LTD (JP)
International Classes:
G01N21/88; G01B11/30
Domestic Patent References:
| WO2022030325A1 | 2022-02-10 |
Foreign References:
| JP2017040600A | 2017-02-23 | |||
| JPH06160066A | 1994-06-07 | |||
| JP2015232476A | 2015-12-24 |
Attorney, Agent or Firm:
YAMAMOTO, Osamu et al. (JP)
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