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Patent Searching and Data


Title:
ARC FAULT DETECTION DEVICE AND METHOD FOR CONTROLLING SAME
Document Type and Number:
WIPO Patent Application WO/2024/053990
Kind Code:
A1
Abstract:
The present invention relates to an arc defect detection device capable of detecting arc defects and a method for controlling same. The arc defect detection device according to the present invention is shipped in a factory reset state in which all functions are initialized after a test to check for functional abnormalities, and when receiving an update instruction from an authorized administrator after being installed in the field, receives an update file from a management device such as an energy management system to proceed with a firmware update and activate an arc fault detection function, thus having the effect of making it possible to preemptively prevent unauthorized copying of the arc defect detection device.

Inventors:
LEE JOONMIN (KR)
HYUN DONG YUB (KR)
JO YEONGMIN (KR)
AHN EUNJI (KR)
YU MIN-HO (KR)
AHN MINHO (KR)
KIM BYUNGJUN (KR)
Application Number:
PCT/KR2023/013234
Publication Date:
March 14, 2024
Filing Date:
September 05, 2023
Export Citation:
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Assignee:
HANWHA SOLUTIONS CORP (KR)
International Classes:
H02S40/32; G01R19/00; G01R19/165; G01R23/00; G01R31/12; G01R35/00; H02S50/00
Foreign References:
KR102397894B12022-05-13
KR102349610B12022-01-11
KR102230366B12021-03-22
JP2017161417A2017-09-14
US20110267721A12011-11-03
Attorney, Agent or Firm:
ERUUM & LEEON INTELLECTUAL PROPERTY LAW FIRM (KR)
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