Title:
ARTIFICIAL INTELLIGENCE-BASED TEST GRADING SYSTEM AND DISEASE DIAGNOSIS METHOD USING SAME
Document Type and Number:
WIPO Patent Application WO/2024/101464
Kind Code:
A1
Abstract:
The present invention relates to an artificial intelligence-based test grading system and a disease diagnosis method using same. The present invention can objectively, easily, and quickly perform grading by establishing machine learning and an algorithm optimized for the machine learning, for a diagnostic test that has a very high possibility of subjective intervention of an evaluator and thus makes objective diagnosis difficult. Accordingly, the present invention may be widely used in several diagnostic test fields in which objective grading and evaluation are difficult.
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Inventors:
KIM MIN YOUNG (KR)
JIN HOON (KR)
PARK JIN YOUNG (KR)
LAU XIAJIUN (KR)
KONG SANG TAEK (KR)
SONG MOON YOUNG (KR)
CHO IN HOO (KR)
JIN HOON (KR)
PARK JIN YOUNG (KR)
LAU XIAJIUN (KR)
KONG SANG TAEK (KR)
SONG MOON YOUNG (KR)
CHO IN HOO (KR)
Application Number:
PCT/KR2022/017382
Publication Date:
May 16, 2024
Filing Date:
November 07, 2022
Export Citation:
Assignee:
GOQBA TECH CORP (KR)
SUNGKWANG MEDICAL FOUND (KR)
SUNGKWANG MEDICAL FOUND (KR)
International Classes:
G16H50/30; A61B5/00; A61B5/16; G06N3/08; G06N20/00; G06V10/30; G06V30/40; G16H10/00; G16H50/20
Foreign References:
| KR102252851B1 | 2021-05-14 | |||
| US20140113258A1 | 2014-04-24 | |||
| JP2019531569A | 2019-10-31 | |||
| KR102338071B1 | 2021-12-14 | |||
| KR102240228B1 | 2021-04-13 |
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (KR)
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