Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
AUTOMATED ANALYZER AND AUTOMATED ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2022/019064
Kind Code:
A1
Abstract:
Provided is an invention that makes it possible to detect abnormal fluctuation in reaction process data acquired in a preprocessing reaction for removing interfering components. This automated analyzer comprises: a reaction process data acquisition unit configured to acquire reaction process data by measuring absorbance in a preprocessing reaction in a time series; a condition setting unit configured to set a condition relating to the absorbance; an abnormal fluctuation determination unit configured to determine, on the basis of the condition set by the condition setting unit, whether the fluctuation in the reaction process data acquired in the preprocessing reaction will influence measurement of the concentration of a specific component in main reaction; and an output unit for outputting the result of the determination made by the abnormal fluctuation determination unit.

Inventors:
IGUCHI AKIHIRO (JP)
MIMURA TOMONORI (JP)
IIJIMA MASAHIKO (JP)
SAGAE NOZOMI (JP)
MOTEGI NAOYA (JP)
Application Number:
PCT/JP2021/024619
Publication Date:
January 27, 2022
Filing Date:
June 29, 2021
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/00
Foreign References:
JP2011149832A2011-08-04
JP2013057587A2013-03-28
JP2015197370A2015-11-09
JP2005181106A2005-07-07
JP2014145750A2014-08-14
JP2004347385A2004-12-09
JP2006023214A2006-01-26
Attorney, Agent or Firm:
TSUTSUI & ASSOCIATES (JP)
Download PDF: