Title:
AUTOMATED ANALYZING DEVICE, AND ABNORMALITY DETERMINING METHOD FOR SAME
Document Type and Number:
WIPO Patent Application WO/2023/074358
Kind Code:
A1
Abstract:
The objective of the present invention is to provide a highly reliable automated analyzing device, and an abnormality determining method for the same. To this end, the present invention provides an automated analyzing device comprising an agitating unit for radiating ultrasonic waves into a reaction vessel to agitate a specimen and a reagent, a power amplifier for applying a voltage to a piezoelectric element of the agitating unit, an impedance measuring unit for measuring an electrical impedance of the piezoelectric element of the agitating unit, an analyzing unit for performing component analysis of a reaction solution of the specimen and the reagent, and a control unit for controlling the agitating unit, the power amplifier, the impedance measuring unit, and the analyzing unit, wherein: a plurality of the agitating units are provided; and the control unit determines, on the basis of the electrical impedance measured by the impedance measuring unit for the plurality of agitating units, a state of connection between the agitating units and either the power amplifier or the impedance measuring unit, or a state of inclination of the automated analyzing device.
Inventors:
HAMADA HIROKI (JP)
KATO HAJIME (JP)
YABUTANI HISASHI (JP)
KATO HAJIME (JP)
YABUTANI HISASHI (JP)
Application Number:
PCT/JP2022/037922
Publication Date:
May 04, 2023
Filing Date:
October 11, 2022
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/00; B06B1/06; G01N35/02
Domestic Patent References:
| WO2021256027A1 | 2021-12-23 |
Foreign References:
| JP2010096638A | 2010-04-30 | |||
| JP2007248413A | 2007-09-27 | |||
| JP2007040843A | 2007-02-15 | |||
| JP2022177414A | 2022-12-01 |
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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