Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
AUTOMATED TEST DEVICE AND TEST METHOD FOR COMPLEX ACCELERATED DEGRADATION TEST
Document Type and Number:
WIPO Patent Application WO/2022/098149
Kind Code:
A1
Abstract:
The present invention relates to an accelerated degradation test for testing the endurance quality of a sample being tested, by increasing the speed of degradation or a defect caused by use environment factors, such as temperature and humidity, and more specifically, to an automated test device for a complex accelerated degradation test, which includes multi-test environments within a single device and is capable of introducing pre-test samples composed of chemical materials into a test environment and transporting the samples to a different test environment, and which enables various and precise accelerated degradation tests by automating the process of storing tested samples in a storage chamber.

Inventors:
BYUN DOO JIN (KR)
JUNG HO (KR)
PARK YOUNGHO (KR)
EOM HYOSANG (KR)
Application Number:
PCT/KR2021/016033
Publication Date:
May 12, 2022
Filing Date:
November 05, 2021
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
KOREA RES INST CHEMICAL TECH (KR)
AB NEXO CO LTD (KR)
International Classes:
G01N17/00; G01N25/00
Foreign References:
KR20110077342A2011-07-07
KR101904000B12018-10-04
KR200319356Y12003-07-07
KR200412679Y12006-03-29
KR101533939B12015-07-06
Attorney, Agent or Firm:
PLUS INTERNATIONAL IP LAW FIRM (KR)
Download PDF: