Title:
AUTOMATIC ANALYSIS DEVICE AND METHOD FOR CLEANING PROBE
Document Type and Number:
WIPO Patent Application WO/2024/075441
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide: an automatic analysis device that reduces the frequency of manual cleaning of a probe and that has a higher analysis efficiency; and a method for cleaning a probe. For this purpose, an automatic analysis device according to the present invention comprises: a probe that dispenses a liquid; and a clogging detection unit that detects clogging of the probe. When the clogging detection unit detects clogging of the probe, the probe is cleaned with a liquid having an adjusted temperature. In addition, a method for cleaning a probe that dispenses a liquid according to the present invention involves cleaning the probe with a liquid having an adjusted temperature when a clogging detection unit detects clogging of the probe.
Inventors:
TANAKA YUTO (JP)
MORI TAKAMICHI (JP)
MORI TAKAMICHI (JP)
Application Number:
PCT/JP2023/031517
Publication Date:
April 11, 2024
Filing Date:
August 30, 2023
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/10
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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