Title:
AUTOMATIC ANALYSIS DEVICE AND OPERATION METHOD THEREOF
Document Type and Number:
WIPO Patent Application WO/2023/053951
Kind Code:
A1
Abstract:
Provided is an automatic analysis device comprising: an operating terminal; an analysis device equipped with an active inspection function of performing a re-examination, which may be necessary after an initial inspection on the same sample, in parallel with the initial inspection; and a computer that can communicate with the analysis device, wherein the computer executes, on the basis of result data of inspections performed in the past, a determination process for determining whether the analysis time when the active inspection function is enabled is shorter than when the active inspection function is disabled, and outputs determination data of the determination process to the operation terminal or the analysis device.
Inventors:
FUKAYA NAOHIKO (JP)
ITO MASAYUKI (JP)
AKUTSU MASASHI (JP)
ITO MASAYUKI (JP)
AKUTSU MASASHI (JP)
Application Number:
PCT/JP2022/034262
Publication Date:
April 06, 2023
Filing Date:
September 13, 2022
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/02; G01N35/00
Foreign References:
| JPH03172764A | 1991-07-26 | |||
| JP2014070900A | 2014-04-21 | |||
| JPS63229369A | 1988-09-26 |
Attorney, Agent or Firm:
KAICHI IP (JP)
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