Title:
AUTOMATIC ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/024535
Kind Code:
A1
Abstract:
Provided is an automatic analysis device that can measure the amount of scattered light of a measurement object while removing the influence of bubbles and can improve the accuracy and reliability of analysis. This automatic analysis device has: an optical detection system provided with a transmitted light detector (42) for receiving transmitted light having transmitted through a measurement object (132) and a scattered light detector (43) for receiving scattered light scattered by the measurement object (132); a waveform acquisition unit (49) for acquiring first scan waveform data from the transmitted light detector (42) and second scan waveform data from the scattered light detector (43); and a data processing unit (48) for, by using the first scan waveform data and the second scan waveform data, specifying the presence/absence of bubbles in the measurement object (132) and a section subjected to the influence of bubbles in the second scan waveform data when there are bubbles.
Inventors:
KARO HIKARU (JP)
NISHIGAKI KENICHI (JP)
NISHIGAKI KENICHI (JP)
Application Number:
PCT/JP2020/010994
Publication Date:
February 11, 2021
Filing Date:
March 13, 2020
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N21/03; G01N21/49; G01N35/00
Foreign References:
| JP2015102428A | 2015-06-04 | |||
| JPH09101312A | 1997-04-15 | |||
| JP2013134139A | 2013-07-08 |
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
Download PDF:
Previous Patent: WATER TREATMENT DEVICE AND WATER TREATMENT METHOD
Next Patent: COMPUTING DEVICE, INPUT DEVICE, COMPUTING METHOD, AND PROGRAM
Next Patent: COMPUTING DEVICE, INPUT DEVICE, COMPUTING METHOD, AND PROGRAM