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Patent Searching and Data


Title:
AUTOMATIC ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/176875
Kind Code:
A1
Abstract:
The purpose of the present disclosure is to provide an automatic analysis device with which it is possible to reduce the risk of infection, injury, device damage, etc., occurring due to manual labor of a user. In the automatic analysis device according to the present disclosure: an unused-container-holding part is configured so as to be capable of holding a cleaning member that cleans a hole for mounting of a reaction container; and a reaction container transport part or a specimen probe picks up the cleaning member from the unused-container-holding part, transports the cleaning member to a reaction container mounting part, and inserts the cleaning member into the hole, thereby cleaning the inner surface of the hole (refer to FIG. 3).

Inventors:
KURIKI SHUN (JP)
NODA KAZUHIRO (JP)
SAKASHITA YUKINORI (JP)
Application Number:
PCT/JP2021/002012
Publication Date:
September 10, 2021
Filing Date:
January 21, 2021
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/04; G01N1/00
Domestic Patent References:
WO2018155300A12018-08-30
Foreign References:
JP2010210346A2010-09-24
JPH04120466A1992-04-21
JP2012527612A2012-11-08
US20080101990A12008-05-01
JP2017194325A2017-10-26
Other References:
See also references of EP 4116716A4
Attorney, Agent or Firm:
HIRAKI & ASSOCIATES (JP)
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