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Patent Searching and Data


Title:
AUTOMATIC ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/029337
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide an automatic analysis device capable of highly reliable analysis in a situation where a light emission amount fluctuates, while suppressing device enlargement and degradation of processing performance. For this purpose, the automatic analysis device of the present invention comprises: a vessel holding part capable of holding a plurality of vessels containing a reaction solution produced by mixing a specimen and a reagent; a light source that emits light; an optical receiver that receives the light emitted by the light source; and a control unit that performs measurement pertaining to light, based on a signal outputted by the optical receiver. The vessels are disposable. The control unit corrects measurement values pertaining to light emitted in positions where the vessels are held in the vessel holding part, on the basis of measurement values pertaining to light emitted in positions where the vessels are not held in the vessel holding part.

Inventors:
MATSUOKA YUYA (JP)
ANDO TAKAHIRO (JP)
Application Number:
PCT/JP2023/026449
Publication Date:
February 08, 2024
Filing Date:
July 19, 2023
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N21/75; G01N35/02
Domestic Patent References:
WO2019073649A12019-04-18
Foreign References:
JP2007322246A2007-12-13
JPS5432387A1979-03-09
JP2004101290A2004-04-02
US5314825A1994-05-24
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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