Title:
AUTOMATIC ANALYZER
Document Type and Number:
WIPO Patent Application WO/2013/069298
Kind Code:
A1
Abstract:
The present invention provides a method and an analyzer capable of determining whether or not measurement results can be guaranteed. The method of the present invention comprises steps that measure optical or electrical attributes of a single specimen for a plurality of analysis items, and includes the following steps: a step wherein an optical or electrical attribute of the single specimen is measured a plurality of times for a first analysis item, thus obtaining a plurality of measured values for the first analysis item; a step for calculating the difference between the plurality of measured values for the first analysis item; a step for determining that measurement results for the single specimen can be guaranteed across the plurality of analysis items in a case where the calculated difference is less than a control value; and a step for determining that measurement results for the single specimen cannot be guaranteed across the plurality of analysis items in a case where the calculated difference is at least the control value.
Inventors:
KONO MAI (JP)
Application Number:
PCT/JP2012/007196
Publication Date:
May 16, 2013
Filing Date:
November 09, 2012
Export Citation:
Assignee:
BECKMAN COULTER INC (US)
KONO MAI (JP)
KONO MAI (JP)
International Classes:
G01N35/00; G01N35/02
Foreign References:
| JP2006292698A | 2006-10-26 | |||
| JP2001228158A | 2001-08-24 | |||
| JPH04138366A | 1992-05-12 | |||
| JP2007248090A | 2007-09-27 |
Attorney, Agent or Firm:
YAMAMOTO, Shusaku et al. (JP)
Shusaku Yamamoto (JP)
Shusaku Yamamoto (JP)
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Claims: