AUTOMATIC MEASUREMENT METHOD AND DEVICE FOR DRIVE CHIP TRANSFERRING PLATFORM

WIPO Patent Application WO/2018/107791

A1

A detection method for an automatic measurement device of a drive chip transferring platform. The automatic measurement device comprises: a platform (1), a pre-positioning suction nozzle (2), a reversing suction nozzle (3), a sensor (4), and a reflector (5). The sensor (4) is fixed to one side of the reversing suction nozzle (3). The reflector (5) is fixed to one side of the pre-positioning suction nozzle (2). The reflector (5) is located below the sensor (4). The detection method comprises the following steps: the automatic measurement device controls a light source to emit light to the reflector (5) (301); the sensor (4) detects a measurement value of the reflector (5) (302); the automatic measurement device determines a curve of measurement values versus heights according to the material of the reflector (5) (303); the automatic measurement device consults the curve to obtain a height value corresponding to the measurement value (304); and the automatic measurement device determines, according to the height value, whether the platform (1) passes the detection (305).

ZHANG GUANGHUI (CN)

PCT/CN2017/097604

June 21, 2018

August 16, 2017

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HKC CORP LTD (CN)
CHONGQING HKC OPTOELECTRONICS TECH CO LTD (CN)

G01B11/06

CN106767455A	2017-05-31
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CN104502828A	2015-04-08
CN102564378A	2012-07-11
CN101553705A	2009-10-07
CN105609449A	2016-05-25
US20160178363A1	2016-06-23

BEIJING HUIZE INTELLECTUAL PROPERTY LAW LLC (CN)

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