AUTOMATIC OPTICAL MEASUREMENT METHOD

WIPO Patent Application WO2002010717

A3

In an automatic optical measurement method according to the invention, with a movable reflection plate 6 moved to place under an optical axis, light projected from a light projecting portion 3a is received by a light receiving portion 3b via the movable reflection plate 6, a stationary reflection plate 11 and the movable reflection plate 6, whereas with the movable reflection plate 6 moved away from the optical axis and a reference 8 set on a sample stage 10, light projected from the light projecting portion 3a is received by the light receiving portion 3b via the reference 8 whereby a ratio between the intensities of the received lights is determined. During a sample measurement, light projected from the light projecting portion 3a with the movable reflection plate 6 moved to place under the optical axis is received by the light receiving portion 3b via the movable reflection plate 6, stationary reflection plate 11 and movable reflection plate 6 so that the intensity of light thus received and the above ratio are used for estimating an intensity of light to be measured with the reference, the estimated intensity of light being used for correcting an intensity of light received via a sample.

INAMOTO NAOKI (JP)
SAWAMURA YOSHIMI (JP)
FUJIMURA SHINJI (JP)
TAGUCHI KUNIKAZU (JP)

PCT/JP2001/006437

April 18, 2002

July 26, 2001

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OTSUKA DENSHI KK (JP)
INAMOTO NAOKI (JP)
SAWAMURA YOSHIMI (JP)
FUJIMURA SHINJI (JP)
TAGUCHI KUNIKAZU (JP)

G01N21/27; G01N21/35; G01N21/55; (IPC1-7): G01N21/55; G01N21/27

US3960077A	1976-06-01
EP0296956A2	1988-12-28
US4666309A	1987-05-19
US6040902A	2000-03-21
US5040889A	1991-08-20

PATENT ABSTRACTS OF JAPAN vol. 013, no. 185 (P - 865) 2 May 1989 (1989-05-02)

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