Title:
BIAS ESTIMATION APPARATUS AND METHOD AND FAILURE DIAGNOSIS APPARATUS AND METHOD
Document Type and Number:
WIPO Patent Application WO/2016/042774
Kind Code:
A1
Abstract:
A bias estimation apparatus according to an embodiment estimates a bias included in a measured values by each sensor. The bias estimation apparatus includes a reference model builder, a temporary bias generator, a corrected measured value calculator, a similarity calculator, a similarity selector, a score calculator, and an estimated bias determiner. The reference model builder builds a reference model of the measured value packs. The temporary bias generator generates a temporary bias pack. The corrected measured value calculator calculates corrected measured value packs. The similarity calculator calculates a similarity of each corrected measured value pack. The similarity selector selects a part of the similarities according to their values from among the similarities. The score calculator calculates a score based on the selected similarities. The estimated bias determiner determines an estimated bias which is an estimated value of the bias based on the score.
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Inventors:
MORIYAMA TAKURO (JP)
AISU HIDEYUKI (JP)
HATANO HISAAKI (JP)
FUJIWARA KENICHI (JP)
AISU HIDEYUKI (JP)
HATANO HISAAKI (JP)
FUJIWARA KENICHI (JP)
Application Number:
PCT/JP2015/004771
Publication Date:
March 24, 2016
Filing Date:
September 17, 2015
Export Citation:
Assignee:
TOSHIBA KK (JP)
International Classes:
G05B13/04; G05B17/02
Foreign References:
| US6577976B1 | 2003-06-10 |
Attorney, Agent or Firm:
KATSUNUMA, Hirohito et al. (Nippon Life Marunouchi Building Marunouchi 1-6-6, Chiyoda-k, Tokyo 05, JP)
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