Title:
BIOMETRIC INFORMATION MEASURING SENSOR, BIOMETRIC INFORMATION MEASURING SYSTEM, AND METHOD OF MEASURING BIOMETRIC INFORMATION USING THE SENSOR
Document Type and Number:
WIPO Patent Application WO/2016/167626
Kind Code:
A1
Abstract:
A biometric information measuring sensor is provided that includes a base comprising a plurality of bio-marker measuring areas and a plurality of electrodes. Each of the plurality of electrodes is disposed on a respective one of the plurality of bio-marker measuring areas, and each of the plurality of electrodes includes a working electrode and a counter electrode spaced apart from the working electrode. The biometric information measuring sensor also includes a plurality of needles. Each of the needles is disposed on a respective one of the plurality of electrodes. Two or more of the plurality of needles have different lengths.
Inventors:
LEE SEUNG-MIN (KR)
CHO SEONG-JE (KR)
CHOI HYOUNG-SEON (KR)
OH YOUNG-JAE (KR)
CHO CHUL-HO (KR)
JUNG SUN-TAE (KR)
CHO JAE-GEOL (KR)
CHO SEONG-JE (KR)
CHOI HYOUNG-SEON (KR)
OH YOUNG-JAE (KR)
CHO CHUL-HO (KR)
JUNG SUN-TAE (KR)
CHO JAE-GEOL (KR)
Application Number:
PCT/KR2016/004005
Publication Date:
October 20, 2016
Filing Date:
April 18, 2016
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
A61B5/145
Domestic Patent References:
WO2008100118A1 | 2008-08-21 |
Foreign References:
US20140336487A1 | 2014-11-13 | |||
US20090099427A1 | 2009-04-16 | |||
US20110144466A1 | 2011-06-16 | |||
US20020091312A1 | 2002-07-11 |
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (13 Eonju-ro 30-gilGangnam-gu, Seoul, KR)
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