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Title:
BOUNDARY SCAN TEST METHOD AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2022/088594
Kind Code:
A1
Abstract:
A boundary scan test method, capable of testing the connectivity of a pad having a direct connection to user logic. The method comprises the following steps: configuring an FPGA to enter a test mode (S10); generating, by means of user logic, a boundary scan chain for a boundary scan test (S20); loading a boundary scan test instruction to the FPGA, and loading a PRELOAD instruction to a device having a pad to be tested for connectivity (S30); sending, via a TDI port, a first test vector to the pad (S40); performing the boundary scan test, and loading an EXTEST instruction to the device having the pad (S50); and removing first response data from a TDO port, and performing response analysis and fault diagnosis (S60). Software configuration is performed in FPGA user logic with respect to a pad to be tested, such that the pad can be tested according to the configuration without the need to test or pass through pads that do not need to be tested. The method shortens boundary scan chains, thereby enabling rapid and flexible boundary scan tests and improving test efficiency.

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Inventors:
ZHAO SHIYUN (CN)
LIU PUXIA (CN)
FU QIPAN (CN)
Application Number:
PCT/CN2021/082534
Publication Date:
May 05, 2022
Filing Date:
March 24, 2021
Export Citation:
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Assignee:
SHENZHEN PANGO MICROSYSTEMS CO LTD (CN)
International Classes:
G01R31/3185
Domestic Patent References:
WO2002071567A12002-09-12
Foreign References:
CN112526327A2021-03-19
CN112526328A2021-03-19
US5627842A1997-05-06
US6163864A2000-12-19
CN109459684A2019-03-12
CN111579974A2020-08-25
US6012155A2000-01-04
US6539491B12003-03-25
US5644580A1997-07-01
JP2001194422A2001-07-19
US5701308A1997-12-23
EP2749894A12014-07-02
Attorney, Agent or Firm:
SHENZHEN CHINA INNOVATION SOUTH INTELLECTUAL PROPERTY AGENCY CO., LTD. (CN)
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