Title:
CALCULATION DEVICE, SURFACE ROUGHNESS PREDICTION SYSTEM, AND CALCULATION METHOD
Document Type and Number:
WIPO Patent Application WO/2022/059633
Kind Code:
A1
Abstract:
This calculation device (12) for predicting the surface roughness of a processed product from a physical quantity comprises: a measurement data acquisition unit (36) which acquires measurement data (SRmea) of surface roughness measured by a surface roughness measuring device; a physical quantity acquisition unit (38) which acquires a physical quantity (PQ) indicating a factor that causes surface roughness; a first amplitude spectrum conversion unit (40) which converts the measurement data (SRmea) into a first amplitude spectrum (F1); a second amplitude spectrum conversion unit (42) which converts the physical quantity (PQ) into a second amplitude spectrum (F2); and a coefficient calculation unit (44) which calculates a coefficient (C) on the basis of a specific frequency (FB), the second amplitude spectrum (F2), and the first amplitude spectrum (F1).
Inventors:
SHIMIZU TOMOKI (JP)
HON YONPYO (JP)
HON YONPYO (JP)
Application Number:
PCT/JP2021/033468
Publication Date:
March 24, 2022
Filing Date:
September 13, 2021
Export Citation:
Assignee:
FANUC CORP (JP)
International Classes:
G05B19/4155; B23Q17/00
Foreign References:
| JP2020035260A | 2020-03-05 | |||
| JP2015134400A | 2015-07-27 | |||
| CN108596158A | 2018-09-28 | |||
| JP2012196740A | 2012-10-18 | |||
| JP2004255535A | 2004-09-16 |
Attorney, Agent or Firm:
CHIBA Yoshihiro et al. (JP)
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