CAPACITOR INSPECTION METHOD AND INSPECTION DEVICE USED IN CAPACITOR INSPECTION METHOD

WIPO Patent Application WO/2023/074627

A1

A capacitor inspection method according to the present invention is characterized by comprising: a DC bias voltage application step for applying a DC bias voltage equal to or lower than a rated voltage to a capacitor to be inspected; a vibration reaction voltage generation step for inputting a first electrical signal to the capacitor, switching to a second electrical signal having a waveform different from that of the first electrical signal, generating vibration including transient vibration from the capacitor, and outputting a reaction voltage including a vibration reaction voltage resulting from the generated vibration including the transient vibration and the DC bias voltage; and a transient response waveform measurement step for measuring a transient response waveform from the vibration reaction voltage of the reaction voltage. Accordingly, it is possible to provide: a capacitor inspection method that enables detection of defects at a high speed and with high reliability by non-destructively inspecting capacitors on a production line within the rated (voltage and current) range using a simple device; and an inspection device used in the capacitor inspection method.

MATSUO REIJIRO (JP)

PCT/JP2022/039539

May 04, 2023

October 24, 2022

Click for automatic bibliography generation  

YURI HOLDINGS CO LTD (JP)

H01G13/00; G01R31/00

JP2021148759A	2021-09-27
JP2009302276A	2009-12-24
JP2003043098A	2003-02-13
JPH11219871A	1999-08-10
JPH10293107A	1998-11-04
JP2000150329A	2000-05-30
JP2009295606A	2009-12-17
JPH09152455A	1997-06-10
JPH09330855A	1997-12-22
JP2017040629A	2017-02-23

ONO Yuki (JP)

View/Download PDF      PDF Help

Previous Patent: OPTICAL LAMINATE, INFRARED INFORMATION ACQUISITION SYSTEM, AND MEETING SUPPORT SYSTEM

Next Patent: ELECTRICAL WIRE