Title:
CELL ABNORMALITY DETECTION CIRCUIT AND POWER SUPPLY DEVICE
Document Type and Number:
WIPO Patent Application WO2010109784
Kind Code:
A1
Abstract:
A cell abnormality detection circuit which is provided with: an SOC detection unit for detecting the SOC of a secondary cell; an internal resistance detection unit for detecting the internal resistance value of the secondary cell; a first state acquisition unit for acquiring the first SOC and the first resistance value at the first timing; a second state acquisition unit for acquiring the second SOC and the second resistance value at the second timing; a memory unit for previously storing relation information indicating the correspondence relation between the SOC and the internal resistance value of the secondary cell; a reference change value setting unit for setting on the basis of the relation information stored in the memory unit a reference change value indicating the magnitude of the change from the internal resistance value corresponding to the first SOC to that corresponding to the second SOC; and a determination unit for determining the occurrence of abnormality in the secondary cell when the magnitude of the change from the first resistance value to the second resistance value is different from the magnitude of the change indicated with the reference change value set by the reference change value setting unit.
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Inventors:
NAKASHIMA TAKUYA
IIDA TAKUMA
IIDA TAKUMA
Application Number:
PCT/JP2010/001502
Publication Date:
September 30, 2010
Filing Date:
March 04, 2010
Export Citation:
Assignee:
PANASONIC CORP (JP)
NAKASHIMA TAKUYA
IIDA TAKUMA
NAKASHIMA TAKUYA
IIDA TAKUMA
International Classes:
G01R31/36; H01M10/48; H02J7/00
Foreign References:
| JP2008253129A | 2008-10-16 | |||
| JP2000215923A | 2000-08-04 | |||
| JP2003204627A | 2003-07-18 | |||
| JP2009071540A | 2009-04-02 |
Attorney, Agent or Firm:
KOTANI, Etsuji et al. (JP)
Etsuji Kotani (JP)
Etsuji Kotani (JP)
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