Title:
CHIP TEST METHOD AND APPARATUS, CHIP, AND COMPUTER READABLE STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2024/060555
Kind Code:
A1
Abstract:
The application discloses a chip test method and apparatus, a chip and a computer readable storage medium. The method comprises: a main controller sends a test instruction to each sub-controller in a storage built-in self-test circuit; a test control circuit configures each sub-controller according to preset groups; each sub-controller in the preset groups is tested according to the test instruction; if the test result is that the preset groups do not meet a preset standard, the sub-controllers are re-grouped on the basis of the test result and iterative testing is performed until the iterative test result is that the current groups meet the preset standard.
Inventors:
OUYANG KEQING (CN)
PENG MINQIANG (CN)
ZHOU GUOHUA (CN)
PAN FEILONG (CN)
CHEN LEI (CN)
PENG MINQIANG (CN)
ZHOU GUOHUA (CN)
PAN FEILONG (CN)
CHEN LEI (CN)
Application Number:
PCT/CN2023/083191
Publication Date:
March 28, 2024
Filing Date:
March 22, 2023
Export Citation:
Assignee:
SANECHIPS TECH CO LTD (CN)
International Classes:
G01R31/28; G06F30/333; G11C29/12
Foreign References:
| CN111833959A | 2020-10-27 | |||
| CN109145338A | 2019-01-04 | |||
| CN111158967A | 2020-05-15 | |||
| CN105070320A | 2015-11-18 | |||
| US7036064B1 | 2006-04-25 | |||
| US20140089875A1 | 2014-03-27 |
Attorney, Agent or Firm:
CENFO INTELLECTUAL PROPERTY AGENCY (CN)
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