Title:
CHIP TEST METHOD, COMPUTING CHIP, AND DATA PROCESSING DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/041934
Kind Code:
A1
Abstract:
A chip test method, a computing chip, and a data processing device. The chip test method comprises: receiving a test vector by means of an input interface of a computing chip to be tested (S100); for each of a plurality of cores to be tested in the computing chip, executing the following operation: transmitting the test data of the core to the core by means of a state machine of the computing chip (S210), wherein the test data is generated according to the test vector; obtaining, by means of the state machine, result data that is generated by the core according to the test data (S220); and outputting a test result by means of an output interface of the computing chip (S300), wherein the test result is generated according to the result data of the plurality of said cores.
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Inventors:
FAN ZHIJUN (CN)
CHEN MO (CN)
GUO HAIFENG (CN)
LIU JIANBO (CN)
YANG ZUOXING (CN)
CHEN MO (CN)
GUO HAIFENG (CN)
LIU JIANBO (CN)
YANG ZUOXING (CN)
Application Number:
PCT/CN2021/099621
Publication Date:
March 03, 2022
Filing Date:
June 11, 2021
Export Citation:
Assignee:
SHENZHEN MICROBT ELECTRONICS TECH CO LTD (CN)
International Classes:
G06F11/22
Foreign References:
| CN111966554A | 2020-11-20 | |||
| US20070288814A1 | 2007-12-13 | |||
| CN102880536A | 2013-01-16 | |||
| CN101976216A | 2011-02-16 | |||
| US20080148117A1 | 2008-06-19 | |||
| US6249893B1 | 2001-06-19 | |||
| CN101788644A | 2010-07-28 |
Attorney, Agent or Firm:
CCPIT PATENT AND TRADEMARK LAW OFFICE (CN)
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