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Patent Searching and Data


Title:
CIRCUIT, METHOD, AND APPARATUS FOR MEASURING CONTACT IMPEDANCE, CHIP, AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/027592
Kind Code:
A1
Abstract:
The present application provides a circuit, method, and apparatus for measuring a contact impedance, a chip, and an electronic device. The circuit for measuring a contact impedance provided in the present application comprises: an excitation signal control port group configured for being connected to a first group of electrodes and outputting or receiving an excitation signal by means of the first group of electrodes, wherein the first group of electrodes comprises any two electrodes of a plurality of electrodes; a voltage signal measurement port group configured for being connected to the first group of electrodes connected with the excitation signal control port group and acquiring voltage signals from the first group of electrodes; a switch module configured for controlling the connection states of each electrode with the excitation signal control port group and the voltage signal measurement port group, respectively; and a measurement module configured for acquiring at least one measured impedance of the first group of electrodes according to the excitation signal and the voltage signal and obtaining contact impedance of at least one electrode according to the measured impedance.

Inventors:
FU HUAJIE (CN)
LI XIAO (CN)
LI JIANQIANG (CN)
Application Number:
PCT/CN2023/109844
Publication Date:
February 08, 2024
Filing Date:
July 28, 2023
Export Citation:
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Assignee:
XIAN CHIPSEA MICROELECTRONICS TECH CO LTD (CN)
CHIPSEA TECH SHENZHEN CORP (CN)
International Classes:
A61B5/053; A61B5/00; A61B5/0531; A61B5/0537
Foreign References:
CN115363556A2022-11-22
US20150293045A12015-10-15
US20150305648A12015-10-29
CN212679093U2021-03-12
CN211962043U2020-11-20
CN114431863A2022-05-06
Attorney, Agent or Firm:
SHENZHEN CHINA INNOVATION SOUTH INTELLECTUAL PROPERTY AGENCY CO., LTD. (CN)
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