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Title:
COARSE-GRAINED DEPTH TESTING METHOD AND GRAPHICS PROCESSOR
Document Type and Number:
WIPO Patent Application WO/2022/067499
Kind Code:
A1
Abstract:
Provided is a coarse-grained depth testing method, comprising: performing a coarse-grained depth test of a current draw-call command; after the coarse-grained depth test of the current draw-call is passed, according to the configuration of the current draw-call, in a coarse-grained depth buffer and for a pixel region associated with the current draw-call, setting the value of a first tag, indicating whether the coarse-grained depth test is disabled for the associated pixel region, and setting the value of a second flag for an associated pixel region in the coarse-grained depth buffer, indicating whether the coarse-grained depth buffer update is disabled for the associated pixel region; on the basis of the coarse-grained depth test (C-Z test) method, if some configurations of the current draw-call have an impact on the coarse-grained depth test of a subsequent draw-call, then constraining the disabling of C-Z tests and C-Z buffer updates to the pixel area corresponding to that marker, and for the remaining pixel regions where coarse-grained depth tests and C-Z buffer updates are not disabled, subsequent draw-calls can continue to perform coarse-grained depth tests and C-Z buffer updates. Thus, in contrast to the prior art where no other subsequent draw-calls for the entire frame after the current draw-call can perform coarse-grained depth tests and C-Z buffer updates, adverse impact on the effectiveness of coarse-grained depth testing is reduced to the greatest possible extent, improving coarse-grained depth testing.

Inventors:
YIN YAYUN (CN)
Application Number:
PCT/CN2020/118805
Publication Date:
April 07, 2022
Filing Date:
September 29, 2020
Export Citation:
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Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
G06T15/00
Foreign References:
US20180286113A12018-10-04
CN109564700A2019-04-02
CN105488842A2016-04-13
CN109643464A2019-04-16
US5579455A1996-11-26
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