Title:
CODING DEVICE, DECODING DEVICE, CODING METHOD AND DECODING METHOD
Document Type and Number:
WIPO Patent Application WO/2019/031136
Kind Code:
A1
Abstract:
A coding device (100) uses a template Frame Rate Up-Conversion (FRUC) method for one or more of a plurality of blocks to process the plurality of blocks in order of processing and code an image, and is provided with a memory (162), and a circuit (160) accessible to the memory (162), wherein the circuit (160) accessible to the memory (162) determines, on the basis of the order of processing, whether each of one or more processed peripheral blocks that are one or more processed blocks among the plurality of blocks and are one or more blocks at the periphery of a block to be processed is referable or not, and generates a template in a region included in one or more referable blocks determined to be referable among the one or more processed peripheral blocks.
Inventors:
ABE KIYOFUMI (JP)
NISHI TAKAHIRO
TOMA TADAMASA
KANOH RYUICHI
HASHIMOTO TAKASHI
NISHI TAKAHIRO
TOMA TADAMASA
KANOH RYUICHI
HASHIMOTO TAKASHI
Application Number:
PCT/JP2018/025954
Publication Date:
February 14, 2019
Filing Date:
July 10, 2018
Export Citation:
Assignee:
PANASONIC IP CORP AMERICA (US)
International Classes:
H04N19/52; H04N19/70; H04N19/96
Domestic Patent References:
| WO2015045276A1 | 2015-04-02 | |||
| WO2010029850A1 | 2010-03-18 |
Foreign References:
| JP2008283612A | 2008-11-20 | |||
| JP2010041115A | 2010-02-18 |
Other References:
CHEN, JIANLE: "Further improvements to HMKTA-1.0", VCEG-AZ07, ITU-T, 19 June 2015 (2015-06-19), XP030003885, Retrieved from the Internet
LIN, YONGBING ET AL.: "Enhanced Template Matching in FRUC Mode", JOINT VIDEO EXPLORATION TEAM (JVET) OF ITU-T SG 16 WP3 JVET-E0035_V1, 11 January 2017 (2017-01-11), Geneva, CH, pages 1 - 4, XP030150503
LIN, YONGBING ET AL.: "Enhanced Template Matching in FRUC Mode", JOINT VIDEO EXPLORATION TEAM (JVET) OF ITU-T SG 16 WP3 JVET-E0035_V1, 11 January 2017 (2017-01-11), Geneva, CH, pages 1 - 4, XP030150503
Attorney, Agent or Firm:
TOKUDA Yoshiaki et al. (JP)
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