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Title:
COLD ATOM-BASED MICROWAVE POWER MEASUREMENT APPARATUS AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2022/041641
Kind Code:
A1
Abstract:
A cold atom-based microwave power measurement apparatus and measurement method. The measurement apparatus comprises a microwave cavity (1), cut-off waveguides (2, 4, 5, 11, 12), a rectangular waveguide (3), and a cold atom vacuum cavity (10). Cooling light is introduced from the upper and lower end faces of the microwave cavity (1) to prepare cold atoms, then the cold atoms in the microwave cavity (1) are coherently excited from a ground state into a Rydberg state by using coupling light (6) and detection light (9) generated by lasers, and the frequency of the coupling light (6) and the frequency the detection light (9) are adjusted to generate a proper detuning amount and achieve a two-photon resonance condition; at the same time, microwaves generated by a microwave source are fed into the rectangular waveguide (3) on a side face of the microwave cavity (1), and are coupled into the cavity to react with the cold atoms, so that a Raman absorption peak of the detection light (9) is split; and a splitting interval of the Raman absorption peak is obtained by fitting, so that the microwave power can be calculated. The present solution uses an electromagnetically induced absorption effect to adiabatic-eliminate an intermediate state to suppress spontaneous emission, so as to obtain signals of Raman absorption spectrum lines having a sub-natural line width, thereby improving the accuracy of microwave power measurement, and having an important value in the aspect of microwave power tracing.

Inventors:
YANG SHUZHE (CN)
CHEN CHANGJUN (CN)
LIAO KAIYU (CN)
ZHANG XINDING (CN)
YAN HUI (CN)
Application Number:
PCT/CN2021/072591
Publication Date:
March 03, 2022
Filing Date:
January 19, 2021
Export Citation:
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Assignee:
UNIV SOUTH CHINA NORMAL (CN)
International Classes:
G01R29/08; G01R21/00
Foreign References:
CN112098710A2020-12-18
CN108983591A2018-12-11
CN107329006A2017-11-07
US20200233025A12020-07-23
US20180031620A12018-02-01
Other References:
LIU, XIAORONG ET AL.: "Microwave Electric Field Measurement Based on Electromagnetically-Induced Transparency and Absorption in Atomic Vapor Cell at Room Temperature", JOURNAL OF SOUTH CHINA NORMAL UNIVERSITY (NATURAL SCIENCE EDITION), vol. 52, no. 3, 25 June 2020 (2020-06-25), pages 10 - 16, XP055902831
CARTER J. D., CHERRY O., MARTIN J. D. D.: "Electric-field sensing near the surface microstructure of an atom chip using cold Rydberg atoms", PHYSICAL REVIEW A, vol. 86, no. 5, 1 November 2012 (2012-11-01), USA , pages 53401, XP055902833, ISSN: 1050-2947, DOI: 10.1103/PhysRevA.86.053401
Attorney, Agent or Firm:
GUANGZHOU RONDA INTELLECTUAL PROPERTY AGENCY (CN)
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