Title:
COMPONENT INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/233840
Kind Code:
A1
Abstract:
Provided is a component inspection device that suppresses a decrease in the accuracy of component inspection and a decrease in the processing amount of component inspection. A component inspection device 1 inspects components while conveying the components and comprises: a linear feeder 20 that conveys components by using vibration at a first frequency; a turntable 30 that conveys the components conveyed by the linear feeder 20; an inspection controller 70 that inspects components on the turntable 30; and a first sensor 61 that detects components on the turntable 30. The inspection controller 70 adjusts the first frequency of vibration of the linear feeder 20 on the basis of the interval between components on the turntable 30, the components detected by the first sensor 61.
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Inventors:
KANAMORI SATORU (JP)
Application Number:
PCT/JP2023/015154
Publication Date:
December 07, 2023
Filing Date:
April 14, 2023
Export Citation:
Assignee:
MURATA MANUFACTURING CO (JP)
International Classes:
B65G27/32; H01G13/00
Foreign References:
| JP2010019731A | 2010-01-28 | |||
| JP2021195202A | 2021-12-27 | |||
| JP2004230208A | 2004-08-19 | |||
| JP2005022769A | 2005-01-27 | |||
| JP2020093908A | 2020-06-18 | |||
| JP2017039604A | 2017-02-23 |
Attorney, Agent or Firm:
KATO Ryuta et al. (JP)
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