Title:
COMPOSITE PROBE CALIBRATION METHOD AND APPARATUS, COMPUTER DEVICE, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2023/226329
Kind Code:
A1
Abstract:
A composite probe calibration method, comprising: applying a near field to a composite probe (100), separately setting input levels of a third interface (230) and a fourth interface (240) of a calibration member to 0, obtaining a first total output signal, a second total output signal and a first feature parameter, wherein the first total output signal and the second total output signal are input signals of a first port and a second port respectively, and obtaining a third total output signal, a fourth total output signal and a second feature parameter, wherein the third total output signal and the fourth total output signal are input signals of the first port and the second port respectively; determining a first signal matrix and a first parameter matrix according to the first total output signal, the second total output signal and the first feature parameter; determining a second signal matrix and a second parameter matrix according to the third total output signal, the fourth total output signal and the second feature parameter; and obtaining a calibration matrix by calculation according to the signal matrices and the parameter matrices, and calibrating near-field parameters of the near-field probe (100). By adjusting the input levels of the interfaces of the calibration member, and constructing a solving equation of the calibration matrix, the problem of non-symmetry is solved, and the problem of asymmetry of a high-frequency band can be solved, so that the verification bandwidth is high. Also provided are a composite probe calibration apparatus, a computer device, a storage medium, and a computer program product.
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Inventors:
SHAO WEIHENG (CN)
XUE SHAN (CN)
FANG WENXIAO (CN)
CHEN YIQIANG (CN)
HUANG YUN (CN)
LU GUOGUANG (CN)
XUE SHAN (CN)
FANG WENXIAO (CN)
CHEN YIQIANG (CN)
HUANG YUN (CN)
LU GUOGUANG (CN)
Application Number:
PCT/CN2022/132484
Publication Date:
November 30, 2023
Filing Date:
November 17, 2022
Export Citation:
Assignee:
CHINA ELECTRONICS RELIABILITY AND ENVIRONMENTAL TESTING INSTITUTE THE FIFTH INSTITUTE OF ELECTRONICS (CN)
International Classes:
G01R35/00; G06F17/16
Foreign References:
| CN115113124A | 2022-09-27 | |||
| CN113900058A | 2022-01-07 | |||
| CN108152575A | 2018-06-12 | |||
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| CN104569888A | 2015-04-29 | |||
| CN105956324A | 2016-09-21 | |||
| CN111398882A | 2020-07-10 | |||
| CN114509714A | 2022-05-17 | |||
| JPH07191122A | 1995-07-28 | |||
| US20130002275A1 | 2013-01-03 | |||
| US5477229A | 1995-12-19 |
Other References:
SHAO WEIHENG; YI ZHIQIANG; HE XIAO; FANG WENXIAO; ZHOU CHANGJIAN; LIU JIESHENG: "Novel Calibration Method for the Asymmetric Probing in the Near-Field Measurement With a Dual Probe", IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, IEEE, USA, vol. 69, no. 12, 27 October 2021 (2021-10-27), USA, pages 5439 - 5448, XP011891432, ISSN: 0018-9480, DOI: 10.1109/TMTT.2021.3120140
SHAO WEIHENG, FAN JIANFENG, TIAN XINXIN, TANG SHA, YI ZHIQIANG, LIU JIESHENG, LIU BIN, HUANG YUN, FANG WENXIAO, ZHOU CHANGJIAN, WU: "Design and Characterization of a Multi-Processed Differential Magnetic Field Probe by Using Asymmetric Calibration Method", IEEE SENSORS JOURNAL, IEEE, USA, vol. 22, no. 6, 15 March 2022 (2022-03-15), USA, pages 5723 - 5731, XP093111826, ISSN: 1530-437X, DOI: 10.1109/JSEN.2022.3148002
SHAO WEIHENG, FAN JIANFENG, TIAN XINXIN, TANG SHA, YI ZHIQIANG, LIU JIESHENG, LIU BIN, HUANG YUN, FANG WENXIAO, ZHOU CHANGJIAN, WU: "Design and Characterization of a Multi-Processed Differential Magnetic Field Probe by Using Asymmetric Calibration Method", IEEE SENSORS JOURNAL, IEEE, USA, vol. 22, no. 6, 15 March 2022 (2022-03-15), USA, pages 5723 - 5731, XP093111826, ISSN: 1530-437X, DOI: 10.1109/JSEN.2022.3148002
Attorney, Agent or Firm:
ADVANCE CHINA IP LAW OFFICE (CN)
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