Title:
CONDUCTION INSPECTION DEVICE AND CONDUCTION INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2020/184679
Kind Code:
A1
Abstract:
Provided are a conduction inspection device and a conduction inspection method which can perform conduction inspection simultaneously with wiring of each of an electric wire and a jumper pin when wiring work is performed on a spring-type terminal block. The conduction inspection device comprises: an inspection jig that is detachably fixed to the spring-type terminal block, and electrically connects a plurality of probes to each conductive part provided across each electric wire insertion part and each jumper pin insertion slot by inserting the plurality of probes into a plurality of jumper pin insertion slots; and a control device that is electrically connected to an electric wire and the plurality of probes wired in the electric wire insertion part, wherein in a state in which the plurality of probes are inserted into the plurality of jumper pin insertion slots, conduction between the electric wire and the conductive part is inspected, and in a state in which the inspection jig is removed from the spring-type terminal block, conduction between the electric wire and a jumper pin is inspected.
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Inventors:
OYAMA YUYA (JP)
Application Number:
PCT/JP2020/010920
Publication Date:
September 17, 2020
Filing Date:
March 12, 2020
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
H01R4/48; G01R31/66
Foreign References:
| JP2006308470A | 2006-11-09 | |||
| JP2017003316A | 2017-01-05 | |||
| JP2017091653A | 2017-05-25 | |||
| JPH0720188A | 1995-01-24 | |||
| JP2010288406A | 2010-12-24 | |||
| JP2008097908A | 2008-04-24 | |||
| JPS586380U | 1983-01-17 | |||
| US20090189625A1 | 2009-07-30 | |||
| US4042878A | 1977-08-16 |
Attorney, Agent or Firm:
SOGA, Michiharu et al. (JP)
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