Title:
CONTACT AND PROBE USING SAME
Document Type and Number:
WIPO Patent Application WO/2013/054558
Kind Code:
A1
Abstract:
Provided are: a contact, which does not have processing strain generated therein even if the contact is long and thin, and has long service life and low manufacture cost; and a probe using the contact. A bellows body (20), a fixed section (30) connected to one end portion (21) of the bellows body (20), and a movable section (40) connected to the other end portion (22) of the bellows body (20) are integrally formed by means of an electroforming method. Then, adjacent circular portions (24, 24) of the bellows body (20) are short-circuited by being in contact with each other when the bellows body (20) is compressed by pressing the movable section (40).
Inventors:
SAKAI TAKAHIRO (JP)
HEMMI YOSHINOBU (JP)
HEMMI YOSHINOBU (JP)
Application Number:
PCT/JP2012/056658
Publication Date:
April 18, 2013
Filing Date:
March 15, 2012
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
SAKAI TAKAHIRO (JP)
HEMMI YOSHINOBU (JP)
SAKAI TAKAHIRO (JP)
HEMMI YOSHINOBU (JP)
International Classes:
H01R33/76; H01R13/24
Foreign References:
| JP2009128218A | 2009-06-11 | |||
| JP3122168U | 2006-06-01 | |||
| JP2011146295A | 2011-07-28 | |||
| JP3120893U | 2006-04-20 | |||
| JP2002164135A | 2002-06-07 |
Other References:
See also references of EP 2747211A4
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
Mutsumi Sameshima (JP)
Mutsumi Sameshima (JP)
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Claims: