Title:
CONTINUOUS ISOKINETIC SAMPLING DEVICE FOR STACK GAS HAVING SUCTION NOZZLE TO WHICH SECTIONAL AREA CONTROL DEVICE IS ATTACHED, AND AUTOMATIC CONTINUOUS MEASUREMENT SYSTEM FOR FINE DUST IN STACK GAS COMPRISING SAME COMBINED THEREWITH
Document Type and Number:
WIPO Patent Application WO/2019/050220
Kind Code:
A1
Abstract:
The present invention relates to a method for sampling particulate matter contained in stack gas and, more particularly, to a continuous isokinetic sampling device for stack gas having a suction nozzle to which a sectional area control device is attached, and an automatic continuous measurement system for fine dust in stack gas comprising the same combined therewith, wherein: in order to suction a sample at the same rate as the flow rate of stack gas in a stack gas emission source, the sectional area of a suction nozzle is automatically controlled so as to suction a sample at the same rate as the flow rate in the emission source, whereby measurement errors due to the inertial force of particulate matter are eliminated; and particulate matter is introduced into a cascade impactor at a constant flow rate of suction gas of 16.67ℓ/min so as to continuously separate the particulate matter into particulate matter less than 10µm (PM10) and particulate matter less than 2.5µm (PM2.5) and automatically measure the PM10 and the PM2.5. The present invention can satisfy both conditions for a sampling device and a cascade impactor for particulate matter in stack gas, which are in conflict with each other, and thus can perform both sampling and automatic continuous measurement of particulate matter in stack gas while minimizing measurement errors.
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Inventors:
KIM KEUN SIK (KR)
KIM DAE WOONG (KR)
KIM DAE WOONG (KR)
Application Number:
PCT/KR2018/010137
Publication Date:
March 14, 2019
Filing Date:
August 31, 2018
Export Citation:
Assignee:
CHUNG ENG CO LTD (KR)
International Classes:
G01N1/22; G01N1/24
Foreign References:
| JP2016118459A | 2016-06-30 | |||
| JP2002340747A | 2002-11-27 | |||
| JP2004191204A | 2004-07-08 | |||
| JP2004077137A | 2004-03-11 | |||
| JP2001188031A | 2001-07-10 | |||
| KR101250249B1 | 2013-04-03 |
Other References:
See also references of EP 3680641A4
Attorney, Agent or Firm:
STYP PATENT LAW FIRM (KR)
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